1. A sample holder for observing arc-shaped samples is characterized by comprising

The support is a U-shaped part and comprises a bottom plate, a left end fixing vertical plate and a right end fixing vertical plate, wherein the left end fixing vertical plate and the right end fixing vertical plate are fixed on the bottom plate, or the left end fixing vertical plate, the right end fixing vertical plate and the bottom plate are integrally formed, the bottom plate is used for supporting an arc-shaped sample, and a through hole is formed in the right end fixing vertical plate;

the movable vertical plate is fixedly provided with a connecting rod which penetrates through the through hole, the movable vertical plate is arranged on the right end fixed vertical plate through the connecting rod, and the position of the movable vertical plate is adjusted along the left-right direction, so that the movable vertical plate is matched with the left end fixed vertical plate to clamp or loosen an arc-shaped sample;

and the locking piece is arranged on the connecting rod and used for locking the position of the adjusted movable vertical plate.

2. The sample holder for observing arc-shaped samples according to claim 1, wherein the connecting rod is a screw rod, the locking member comprises a locking nut which is in threaded connection with the screw rod, the locking nut is positioned on the left side of the right end fixed vertical plate, and the locking nut is matched with the hole edge of the through hole in a blocking manner to lock the position of the movable vertical plate.

3. The sample holder for observing arc-shaped samples according to claim 2, wherein the locking member comprises a stop nut, the stop nut is in threaded connection with the screw rod, the stop nut is located on the right side of the right-end fixed vertical plate, and the locking nut and the stop nut clamp the right-end fixed vertical plate.

4. The sample holder for observing the arc-shaped sample according to claim 1, further comprising two pressing pieces, wherein the two pressing pieces are respectively arranged on the left end fixed vertical plate and the movable vertical plate, and the pressing pieces can move up and down to press the arc-shaped sample on the bottom plate;

and the pressing piece is provided with a fastener, and the fastener is used for fixing the position of the moved pressing piece.

5. The sample holder for observing arc-shaped samples according to claim 4, wherein the pressing member is a U-shaped member having a groove, and the left end fixed vertical plate and the movable vertical plate are respectively inserted into the corresponding grooves of the U-shaped member, so that the two U-shaped members respectively move up and down along the left end fixed vertical plate and the movable vertical plate.

6. The sample holder for arcuate sample observation according to claim 5, wherein said fastener is a set screw mounted on said U-shaped member.

7. The sample holder of claim 1, wherein the holder is made of a non-magnetic metal.

Background

Metallographic detection is one of important detection means for steel and steel part inspection, samples are selected according to the size specifications of the steel and the steel parts, and the samples are irregular in shape and can generate semi-arc samples or even quarter-arc samples. For example, a round bar with a diameter less than 40mm needs to be inspected by cutting a section parallel to the rolling direction of the steel if non-metallic inclusions, a band-shaped structure and the like need to be inspected, and the standard sample is a semicircle or a quarter circle. For example, bearing steel balls are basically arc-shaped samples no matter how they are sampled. Due to size limitation, if the sample needs to be further cut into a regular rectangular sample, the sample can only be cut by adopting a wire cut electrical discharge machining mode, and long time is consumed.

When the upright metallographic microscope or the scanning electron microscope is used for observing a sample, the detection surface of the sample is upward, and the non-detection surface of the sample is arc-shaped, so that the sample cannot be directly placed on a sample table. In the conventional method in the prior art, when a metallographic microscope or a scanning electron microscope is used for observation, a sample is placed on a flat plate stuck with plasticine, and then is flattened and fixed by a flattening device. Therefore, the detection surface can be in contact with the flattener, so that pollution can occur and subsequent observation is influenced. Even, when the rubber clay is used for observation by a scanning electron microscope, the rubber clay can soften in an electron microscope sample chamber for a long time, so that the sample can possibly fall off, the sample cannot be continuously observed, and the equipment is damaged.

Therefore, there is a need to provide an improved solution to the above-mentioned deficiencies of the prior art.

Disclosure of Invention

It is an object of the present application to provide a sample holder for arc-shaped sample observation to solve or alleviate the above-mentioned problems in the prior art.

In order to achieve the above purpose, the present application provides the following technical solutions: a sample holder for arc-shaped sample observation comprises

The support is a U-shaped part and comprises a bottom plate, a left end fixing vertical plate and a right end fixing vertical plate, wherein the left end fixing vertical plate and the right end fixing vertical plate are fixed on the bottom plate, or the left end fixing vertical plate, the right end fixing vertical plate and the bottom plate are integrally formed, the bottom plate is used for supporting an arc-shaped sample, and a through hole is formed in the right end fixing vertical plate;

the movable vertical plate is fixedly provided with a connecting rod which penetrates through the through hole, the movable vertical plate is arranged on the right end fixed vertical plate through the connecting rod, and the position of the movable vertical plate is adjusted along the left-right direction, so that the movable vertical plate is matched with the left end fixed vertical plate to clamp or loosen an arc-shaped sample;

and the locking piece is arranged on the connecting rod and used for locking the position of the adjusted movable vertical plate.

Furthermore, the connecting rod is a screw rod, the locking piece comprises a locking nut in threaded connection with the screw rod, the locking nut is located on the left side of the right end fixing vertical plate, and the locking nut is matched with the hole edge of the through hole in a blocking mode to lock the position of the movable vertical plate.

Furthermore, the locking piece comprises a stop nut, the stop nut is in threaded connection with the screw rod, the stop nut is located on the right side of the right end fixing vertical plate, and the locking nut and the stop nut clamp the right end fixing vertical plate.

The arc-shaped test sample clamping device comprises a left end fixed vertical plate, a left end movable vertical plate, a left end clamping plate, a right end clamping plate, a left end clamping plate and a right end clamping plate, and is characterized by further comprising two clamping pieces, wherein the two clamping pieces are respectively arranged on the left end fixed vertical plate and the movable vertical plate, and can move up and down to clamp the arc-shaped test sample on the bottom plate;

and the pressing piece is provided with a fastener, and the fastener is used for fixing the position of the moved pressing piece.

Furthermore, the pressing piece is a U-shaped piece and is provided with a groove, and the left end fixed vertical plate and the movable vertical plate are respectively inserted into the corresponding grooves of the U-shaped piece, so that the two U-shaped pieces respectively move up and down along the left end fixed vertical plate and the movable vertical plate.

Further, the fastener is a set screw mounted on the U-shaped member.

Furthermore, the support is made of nonmagnetic metal materials.

Compared with the closest prior art, the technical scheme of the embodiment of the application has the following beneficial effects:

1) the sample frame for observing the arc-shaped sample is convenient to load the arc-shaped sample, does not pollute a detection surface, and saves sample cutting time.

2) The locking nut on the screw rod is matched with the stop at the hole edge of the through hole, so that the structure is simple, the manufacturing is convenient, and the operation is convenient.

3) The locking nut is matched with the stopping nut, so that the position of the movable vertical plate is reliably ensured.

4) The pressing piece can be matched with the bottom plate, the fixed vertical plate at the left end and the movable vertical plate to form five-point fixation on the arc-shaped sample, and the reliable clamping of the arc-shaped sample is more stably ensured.

5) The U-shaped piece forms a pressing piece, and the structure is simple and the operation is convenient.

6) The fastening screw forms a fastening piece, so that the operation is convenient and the processing is convenient.

7) The scanning electron microscope has the main principle that a focused high-energy electron beam acts on the surface of a sample to generate various different electronic signals, and the related information of the sample is obtained by collecting the different electronic signals. The magnetic material affects the electron beam and electron signal, thereby affecting the analysis result. If a non-conductive support is adopted, the sample is not communicated with the ground of the electron microscope, and the surface of the sample can form charge accumulation to influence observation. Therefore, the support is made of nonmagnetic metal materials, and the detection result during scanning electron microscopy can be ensured.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate embodiments of the application and, together with the description, serve to explain the application and are not intended to limit the application. Wherein:

FIG. 1 is a state diagram of the use of an embodiment of a sample holder for arcuate sample observation according to the present application (when the arcuate sample is a hemispherical specimen);

FIG. 2 is a top view of FIG. 1;

FIG. 3 is a state diagram of the use of a particular embodiment of a sample holder for arcuate sample observation according to the present application (when the arcuate sample is a quarter-sphere sample);

fig. 4 is a schematic structural view of the set screw, the left end fixed vertical plate and the pressing member in fig. 1.

Description of reference numerals:

1-a bottom plate; 2-fixing a vertical plate at the left end; 3-fixing a vertical plate at the right end; 4, moving a vertical plate; 5, pressing parts; 6-set screw; 7-locking the nut; 8-stop nut; 9-hemispherical sample; 10-quarter sphere sample; 11-connecting rod.

Detailed Description

The present application will be described in detail below with reference to the embodiments with reference to the attached drawings. The various examples are provided by way of explanation of the application and are not limiting of the application. In fact, it will be apparent to those skilled in the art that modifications and variations can be made in the present application without departing from the scope or spirit of the application. For instance, features illustrated or described as part of one embodiment, can be used with another embodiment to yield a still further embodiment. It is therefore intended that the present application cover the modifications and variations of this invention provided they come within the scope of the appended claims and their equivalents.

In the description of the present application, the terms "longitudinal", "lateral", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description of the present application but do not require that the present application must be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present application. The terms "connected," "connected," and "disposed" as used herein are intended to be broadly construed, and may include, for example, fixed and removable connections; can be directly connected or indirectly connected through intermediate components; the specific meaning of the above terms can be understood by those of ordinary skill in the art as appropriate.

The application provides an embodiment of a sample frame for arc sample observation, as shown in fig. 1, fig. 2 and fig. 3, a sample frame for arc sample observation includes support, activity riser 4, two and compress tightly 5, and its mainly used presss from both sides tight fixedly to the arc sample to be convenient for the metallography and the scanning electron microscope inspection operation of arc sample go on.

The support is the stainless steel, difficult rust and no magnetism metal material such as aluminum alloy, the support includes bottom plate 1, the fixed riser of left end 2 and the fixed riser 3 of right-hand member, the fixed riser of left end 2 and the fixed equal perpendicular to bottom plate 1 of right-hand member 3, bottom plate 1 connects, the fixed riser of left end 2 and the fixed riser 3 of right-hand member, in this embodiment, the fixed riser of left end 2 and the fixed riser 3 of right-hand member are fixed on bottom plate 1, in other embodiments, also can adopt the fixed riser of left end, the fixed riser of right-hand member and bottom plate integrated into one piece's form. The arc sample is placed on bottom plate 1, and bottom plate 1 is used for supporting the arc sample, is equipped with the through-hole on the fixed riser 3 of right-hand member, and the through-hole is the unthreaded hole.

Be fixed with connecting rod 11 on the activity riser 4, connecting rod 11 is the screw rod, and connecting rod 11 passes the through-hole, and activity riser 4 passes through connecting rod 11 and sets up on the fixed riser 3 of right-hand member, and activity riser 4 can be followed left right direction adjustment position, makes the fixed riser 2 of activity riser 4 cooperation left end press from both sides tightly or loosen the arc sample.

The locking piece sets up on connecting rod 11 for the position of the activity riser 4 after the locking adjustment, it is specific: the locking piece comprises a locking nut 7 and a stop nut 8, the locking nut 7 is in threaded connection with the screw, the stop nut 8 is located on the right side of the right end fixing vertical plate 3, the locking nut 7 and the stop nut 8 clamp the right end fixing vertical plate 3 tightly.

As shown in fig. 4, two compressing pieces 5 are respectively arranged on the fixed vertical plate 2 and the movable vertical plate 4 at the left end, and the compressing pieces 5 can move up and down to compress the arc-shaped sample on the bottom plate 1, specifically: the pressing piece 5 is a U-shaped piece and is provided with a groove, and the left end fixed vertical plate 2 and the left end movable vertical plate 4 are respectively inserted into the grooves of the corresponding U-shaped pieces. The pressing piece 5 is provided with a fastener, the fastener is used for fixing the position of the pressing piece 5 after moving, and the fastener is a set screw 6 arranged on the U-shaped piece.

The size of the bottom plate 1 is 30 +/-2 mm (height) multiplied by 10 +/-2 mm (length) multiplied by 5 +/-0.5 mm (thickness), and the height of the left end fixed vertical plate 2 and the right end fixed vertical plate 3 is 30 +/-2 mm and the length is 10 +/-2 mm. The height of the movable vertical plate 4 is 25 +/-1 mm, and the length is 10 +/-1 mm.

The method of using the sample holder for observing the arc-shaped sample in the embodiment of the invention is as follows (taking the hemispherical sample 9 and the quarter-spherical sample 10 as an example, the hemispherical sample 9 and the quarter-spherical sample 10 belong to the arc-shaped sample): as shown in fig. 1, 2 and 3, an arc-shaped sample is placed on a bottom plate 1, a detection surface is kept as a horizontal plane as much as possible during placement, and the left side of the arc-shaped sample is tightly attached to a left end fixed vertical plate 2; move down and press 5 to the detection face of arc sample on the fixed riser 2 of left end, fix through the fastener and press 5. The movable vertical plate 4 is pushed leftwards to contact the right side of the arc-shaped sample, and the locking nut 7 and the stopping nut 8 are screwed tightly to ensure that the position of the movable vertical plate 4 is fixed. When the pressing piece 5 on the left end fixed vertical plate 2 moves downwards to the detection surface of the arc-shaped sample, the pressing piece 5 is fixed through a fastener. Five-point fixation (a bottom plate 1, a left end fixed vertical plate 2, a movable vertical plate 4 and two pressing pieces 5) is formed on the arc-shaped sample, and metallographic observation or scanning electron microscope observation can be directly carried out. And after the detection is finished, loosening the pressing piece 5 on the movable vertical plate 4, loosening the locking piece, pulling the movable vertical plate 4 rightwards, loosening the pressing piece 5 on the fixed vertical plate 2 at the left end, and taking out the arc-shaped sample.

The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.