1. The automatic test system of the SSD is characterized by comprising an industrial personal computer, and at least one PC and a PLC control system which are connected with the industrial personal computer; the industrial personal computer stores the identification of each PC in advance; the PLC control system also comprises a PLC device and a transmission device connected with the PLC device;

the industrial personal computer is used for responding to starting operation of an automatic testing system acting on the SSD and sending a trigger signal to the PLC device so as to trigger the PLC device to control the transmission device to transmit the SSD to be tested to a preset testing area from a preset placing area, so that the SSD to be tested is electrically connected with the PC;

the PLC device is used for monitoring a confirmation signal of the SSD to be tested placed in the test area and sending a connection instruction to the industrial personal computer after monitoring the confirmation signal;

the industrial personal computer is also used for sending a test instruction to at least one PC machine when receiving the connection instruction;

and the PC is used for starting a pre-stored testing algorithm according to a preset testing logic after receiving the testing instruction so as to automatically test the SSD to be tested in the testing area.

2. The automated testing system for the SSD of claim 1, wherein the predetermined placement area is configured to place a plurality of SSDs to be tested arranged in a predetermined array; the test area is provided with a fixing jig for fixing the SSD to be tested;

the fixing jig comprises a first testing jig and a second testing jig which are matched with each other, wherein the first testing jig is used for fixing the SSD to be tested, and the second testing jig is used for electrically connecting the SSD to be tested with the corresponding PC when the SSD to be tested is fixed on the first testing jig.

3. The automated SSD testing system of claim 2, wherein the first test fixture comprises at least one test slot for securing the SSD to be tested;

each test slot is configured with a first test interface, and when the SSD to be tested is placed in the test slot, the first test interface is electrically connected with the SSD to be tested.

4. The automated test system of claim 3, wherein the second test fixture comprises at least one second test interface corresponding to the first test interface;

the second test interface is further connected with the test interface of the PC, so that when the SSD to be tested is fixed on the first test fixture, the SSD to be tested is electrically connected with the corresponding PC through the first test interface and the second test interface.

5. The automated test system of an SSD of claim 2, further configured with a high temperature test system connected to the PLC device;

the second test fixture is arranged in an area corresponding to the high-temperature test system and used for carrying out high-temperature reliability test on the SSD to be tested under the control of the PLC equipment.

6. The automated test system of an SSD of claim 1, wherein the automated test system of an SSD is further configured with an automatic reclamation apparatus;

the PC is also used for sending a test failure signal to the industrial personal computer if the test failure signal is monitored in the automatic test process of the SSD to be tested;

the industrial personal computer is further used for triggering the PLC equipment to control the transmission equipment to transmit the SSD to be tested corresponding to the PC which sends the test failure signal to the automatic recovery device after receiving the test failure signal.

7. The automated test system of an SSD of claim 6, wherein the pre-stored test algorithms in the PC comprise at least one of the following test algorithms: presetting a logic card opening algorithm, a high-temperature reliability test algorithm and a normal-temperature test algorithm;

the PC is also used for sending the test failure signal to the industrial personal computer if the test failure signal is monitored when any test algorithm is started; or in any card opening process corresponding to the card opening algorithm, if a test failure signal is monitored, the test failure signal is sent to the industrial personal computer.

8. The automated test system of an SSD of claim 7, wherein the automated test system of an SSD is further configured with a good placement area;

the PC is also used for sending a test completion signal to the industrial personal computer after the automatic test process of the SSD to be tested is finished;

the industrial personal computer is further used for triggering the PLC equipment to control the transmission equipment to transmit the SSD to be tested corresponding to the PC machine which sends the test completion signal to the qualified product placing area after receiving the test completion signal.

9. An automatic testing method for an SSD, which is applied to the automatic testing system for the SSD according to any one of claims 1 to 8, the method comprising:

the industrial personal computer responds to the starting operation of the automatic testing system acting on the SSD and sends a trigger signal to the PLC device to trigger the PLC device to control the transmission device to transmit the SSD to be tested to a preset testing area from a preset placing area so as to electrically connect the SSD to be tested with the PC;

the PLC device monitors a confirmation signal of the SSD to be tested placed in the test area, and sends a connection instruction to the industrial personal computer after monitoring the confirmation signal;

the industrial personal computer is also used for sending a test instruction to at least one PC machine when receiving the connection instruction;

and after receiving the test instruction, the PC starts a pre-stored test algorithm according to a preset test logic so as to automatically test the SSD to be tested in the test area.

10. The method of claim 9, further comprising:

monitoring a test failure signal in the automatic test process of the SSD to be tested through the PC, and if the test failure signal is monitored, sending the test failure signal to the industrial personal computer;

the industrial personal computer is further used for triggering the PLC equipment to control the transmission equipment to transmit the SSD to be tested corresponding to the PC which sends the test failure signal to the automatic recovery device after receiving the test failure signal.

Background

Compared with a mechanical hard Disk, the SSD (Solid State Disk) has the advantages of obvious speed, and very high response speed during software loading and daily operation; generally, the SSD is composed of a PCB, a control chip, a cache chip, a flash memory chip for storing data, and some electronic materials, and is mounted on the PCB, so that the SSD has a lighter structure than a mechanical hard disk, and the weight and volume of the PC can be further reduced; in addition, compared with a mechanical hard disk, the SSD also has the advantages of being resistant to falling and collision, free of noise and the like.

With the rapid development of the semiconductor technology, the 3D stacking technology is continuously innovated, the process yield is improved and the like, so that the price of the current flash memory particles is reduced, and the price of the SSD is directly reduced, and the SSD becomes the preferred hard disk for a terminal customer when the terminal customer configures the PC; with the increase of the demand of the SSD, if the SSD manufacturer wants to make a product with high cost performance, it is necessary to reduce the production cost as much as possible.

At present, the production and test process flow of the SSD is high in occupied time and cost, most of the existing SSD test flow is manually tested, so that the SSD has high requirements on labor cost, the connection flow of each section is complex during manual test, a large amount of time cost is wasted, and the test efficiency of the SSD is also reduced.

Disclosure of Invention

Accordingly, the present invention is directed to an automatic testing system and method for SSD, so as to alleviate the above technical problems.

In a first aspect, an embodiment of the present invention provides an SSD automatic test system, which includes an industrial personal computer, and at least one PC and a PLC control system connected to the industrial personal computer; the industrial personal computer stores the identification of each PC in advance; the PLC control system also comprises a PLC device and a transmission device connected with the PLC device; the industrial personal computer is used for responding to starting operation of an automatic testing system acting on the SSD and sending a trigger signal to the PLC device so as to trigger the PLC device to control the transmission device to transmit the SSD to be tested to a preset testing area from a preset placing area, so that the SSD to be tested is electrically connected with the PC; the PLC device is used for monitoring a confirmation signal of the SSD to be tested placed in the test area and sending a connection instruction to the industrial personal computer after monitoring the confirmation signal; the industrial personal computer is also used for sending a test instruction to at least one PC machine when receiving the connection instruction; and the PC is used for starting a pre-stored testing algorithm according to a preset testing logic after receiving the testing instruction so as to automatically test the SSD to be tested in the testing area.

Preferably, in a possible implementation manner, the preset placing area is used for placing a plurality of SSDs to be tested, which are arranged according to a preset array; the test area is provided with a fixing jig for fixing the SSD to be tested; the fixing jig comprises a first testing jig and a second testing jig which are matched with each other, wherein the first testing jig is used for fixing the SSD to be tested, and the second testing jig is used for electrically connecting the SSD to be tested with the corresponding PC when the SSD to be tested is fixed on the first testing jig.

Preferably, in a possible embodiment, the first test fixture includes at least one test slot for fixing the SSD to be tested; each test slot is configured with a first test interface, and when the SSD to be tested is placed in the test slot, the first test interface is electrically connected with the SSD to be tested.

Preferably, in a possible implementation manner, the second test fixture includes at least one second test interface corresponding to the first test interface; the second test interface is further connected with the test interface of the PC, so that when the SSD to be tested is fixed on the first test fixture, the SSD to be tested is electrically connected with the corresponding PC through the first test interface and the second test interface.

Preferably, in a possible implementation manner, the automatic test system of the SSD is further configured with a high-temperature test system connected to the PLC device; the second test fixture is arranged in an area corresponding to the high-temperature test system and used for carrying out high-temperature reliability test on the SSD to be tested under the control of the PLC equipment.

Preferably, in a possible implementation, the automatic test system of the SSD is further configured with an automatic recovery device; the PC is also used for sending a test failure signal to the industrial personal computer if the test failure signal is monitored in the automatic test process of the SSD to be tested; the industrial personal computer is further used for triggering the PLC equipment to control the transmission equipment to transmit the SSD to be tested corresponding to the PC which sends the test failure signal to the automatic recovery device after receiving the test failure signal.

Preferably, in a possible implementation, the testing algorithm pre-stored in the PC includes at least one of the following testing algorithms: presetting a logic card opening algorithm, a high-temperature reliability test algorithm and a normal-temperature test algorithm; the PC is also used for sending the test failure signal to the industrial personal computer if the test failure signal is monitored when any test algorithm is started; or in any card opening process corresponding to the card opening algorithm, if a test failure signal is monitored, the test failure signal is sent to the industrial personal computer.

Preferably, in a possible implementation, the automatic test system of the SSD is further configured with a good placement area; the PC is also used for sending a test completion signal to the industrial personal computer after the automatic test process of the SSD to be tested is finished; the industrial personal computer is further used for triggering the PLC equipment to control the transmission equipment to transmit the SSD to be tested corresponding to the PC machine which sends the test completion signal to the qualified product placing area after receiving the test completion signal.

In a second aspect, an embodiment of the present invention further provides an automatic testing method for an SSD, which is applied to the automatic testing system for an SSD in the first aspect, and the method includes: the industrial personal computer responds to the starting operation of the automatic testing system acting on the SSD and sends a trigger signal to the PLC device to trigger the PLC device to control the transmission device to transmit the SSD to be tested to a preset testing area from a preset placing area so as to electrically connect the SSD to be tested with the PC; the PLC device monitors a confirmation signal of the SSD to be tested placed in the test area, and sends a connection instruction to the industrial personal computer after monitoring the confirmation signal; the industrial personal computer is also used for sending a test instruction to at least one PC machine when receiving the connection instruction; and after receiving the test instruction, the PC starts a pre-stored test algorithm according to a preset test logic so as to automatically test the SSD to be tested in the test area.

Preferably, in a possible embodiment, the method further comprises: monitoring a test failure signal in the automatic test process of the SSD to be tested through the PC, and if the test failure signal is monitored, sending the test failure signal to the industrial personal computer; the industrial personal computer is further used for triggering the PLC equipment to control the transmission equipment to transmit the SSD to be tested corresponding to the PC which sends the test failure signal to the automatic recovery device after receiving the test failure signal.

The embodiment of the invention has the following beneficial effects:

according to the automatic testing system and method for the SSD, the starting operation can be responded through the industrial personal computer, the PLC device controls the transmission device to transmit the SSD to be tested to the preset testing area from the preset placing area, so that the SSD to be tested is electrically connected with the PC, the industrial personal computer sends the testing instruction to the PC after the SSD to be tested is confirmed to be placed in the testing area, the PC starts the pre-stored testing algorithm according to the preset testing logic after receiving the testing instruction, the SSD to be tested fixed on the fixing jig is automatically tested, manual intervention is not needed in the whole automatic testing process, the production process of the SSD can be simplified, the production efficiency can be improved, the production cost and the labor cost are reduced, the practicability is high, and the testing efficiency of the SSD is further improved.

Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.

In order to make the aforementioned and other objects, features and advantages of the present invention comprehensible, preferred embodiments accompanied with figures are described in detail below.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.

Fig. 1 is a schematic structural diagram of an automatic test system of an SSD according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of another exemplary SSD automated test system according to an embodiment of the present invention;

FIG. 3 is a schematic diagram of an SSD under test in a placement area according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of a first test fixture according to an embodiment of the present invention;

fig. 5 is a schematic structural diagram of a second test fixture according to an embodiment of the present invention;

FIG. 6 is a schematic diagram illustrating a testing process of an SSD automated testing system according to an embodiment of the present invention;

fig. 7 is a flowchart of an automatic testing method for an SSD according to an embodiment of the invention.

Detailed Description

To make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Currently, the SSD Testing process mainly includes a K1& K2& K3 card opening test, a high temperature RDT (Reliability Demonstration Testing) test, a bit (burn intest) aging test, a defective product screening, and the like; moreover, most of the existing testing processes are manually tested, so that the requirement on labor cost is high, meanwhile, the connection process of each section is complicated during manual testing, and a large amount of time and cost are wasted.

For the convenience of understanding the present embodiment, first, the automatic test system for SSD disclosed in the present embodiment will be described in detail.

In a possible implementation manner, an embodiment of the present invention provides an automatic test system for an SSD, and in particular, a schematic structural diagram of an automatic test system for an SSD as shown in fig. 1, the automatic test system for an SSD includes an industrial personal computer 10, and at least one PC 20 and a PLC (Programmable Logic Controller) control system 30 connected to the industrial personal computer 10; the industrial personal computer 10 stores the identifier of each PC in advance; such as an IP address of each PC, etc., so as to control the operation state of each PC, and the PLC control system 30 includes a PLC device 301, and a driving device 302 connected to the PLC device 301.

During specific implementation, the industrial personal computer is used for responding to starting operation of an automatic test system acting on the SSD and sending a trigger signal to the PLC device so as to trigger the PLC device to control the transmission device to transmit the SSD to be tested to a preset test area from a preset placing area, so that the SSD to be tested is electrically connected with the PC.

At this moment, the PLC device can be used for monitoring a confirmation signal of the SSD to be tested placed in the test area and sending a connection instruction to the industrial personal computer after monitoring the confirmation signal; the industrial personal computer is also used for sending a test instruction to at least one PC machine when receiving the connection instruction; and the PC is used for starting a pre-stored testing algorithm according to a preset testing logic after receiving the testing instruction so as to automatically test the SSD to be tested in the testing area.

The automatic testing system of the SSD provided by the embodiment of the invention can respond to the starting operation through the industrial personal computer, and the PLC device controls the transmission device to transmit the SSD to be tested to the preset testing area from the preset placing area, so that the SSD to be tested is electrically connected with the PC, and after the SSD to be tested is confirmed to be placed in the testing area, the testing instruction is sent to the PC through the industrial personal computer, so that the PC starts the pre-stored testing algorithm according to the preset testing logic after receiving the testing instruction, so as to automatically test the SSD to be tested fixed on the fixed jig, and the whole automatic testing process does not need manual intervention, thereby simplifying the production process of the SSD, improving the production efficiency, reducing the production cost and the labor cost, having strong practicability and further improving the testing efficiency of the SSD.

In practical use, the industrial personal computer is also a computer generally, can be used as a control end host, and is provided with local area network monitoring software and the like, and the industrial personal computer is generally provided with a specific hardware interface, such as a COM port or a USB port and the like, and meanwhile, the industrial personal computer can also have strong pressure resistance, shock resistance and dust resistance, and a user can select required hardware configuration by himself to meet the hardware requirements of the automatic test system of the whole SSD.

Further, the starting operation of the automatic test system acting on the SSD generally refers to a starting operation of a tester or a developer on the automatic test system of the SSD, for example, the tester starts the industrial computer, opens a corresponding SSD automatic test flow, and after starting the PLC device and the PC device, the industrial computer may automatically respond, and further send a trigger signal to the PLC device, start to transmit the SSD to be tested to a test area, to execute an automatic test process of the SSD, and the like.

Moreover, for an industrial personal computer, the PLC device and the PC device are usually external devices, and the industrial personal computer may be connected to the PLC device and the PC device by wire, or wirelessly, for example, the industrial personal computer may be connected to the PLC device by a COM port or a USB port, and wirelessly connected to the PC by a local area network, and the like.

Further, considering that the number of SSDs to be tested is usually large, the at least one PC connected to the industrial personal computer is usually also plural, that is, the PCs are usually set in the form of PC device groups, and each PC corresponds to one SSD in the automatic testing process of the SSDs, so that the SSDs can be tested simultaneously. Therefore, a plurality of SSDs to be tested are usually placed in the predetermined placement area.

Specifically, the preset placing area is used for placing a plurality of SSDs to be tested, which are arranged according to a preset array; in order to test the SSD, the test area is also configured with a fixing fixture for fixing the SSD to be tested. In order to facilitate the transmission equipment to place the SSD to be tested, the placing area and the testing area are arranged in adjacent areas, so that the transmission path of the transmission equipment is simplified.

Further, the fixing jig comprises a first testing jig and a second testing jig which are matched with each other, wherein the first testing jig is used for fixing the SSD to be tested, and the second testing jig is used for electrically connecting the SSD to be tested with the corresponding PC when the SSD to be tested is fixed on the first testing jig.

The first test fixture comprises at least one test slot for fixing the SSD to be tested; each test slot is provided with a first test interface, and when the SSD to be tested is placed in the test slot, the first test interface is electrically connected with the SSD to be tested. The second test fixture comprises at least one second test interface corresponding to the first test interface; the second test interface is further connected with the test interface of the PC, so that when the SSD to be tested is fixed on the first test fixture, the SSD to be tested is electrically connected with the corresponding PC through the first test interface and the second test interface.

For convenience of understanding, on the basis of fig. 1, fig. 2 shows a schematic structural diagram of another automated testing system for an SSD, which includes an industrial personal computer 10, a PLC device 301, and a plurality of PCs, wherein the industrial personal computer serves as a control end host, and therefore, an operating platform of the automated testing system equivalent to the entire SSD, that is, the operating platform of the industrial personal computer in fig. 2, is in communication connection with the plurality of PCs, wherein fig. 2 shows an embodiment in which the plurality of PCs form a PC device group, which includes PCs 1 and PCs 2 … PCn.

Further, the PLC device generally includes a PLC controller and a control circuit, and a transmission device connected to the PLC device is generally a pneumatic transmission device, so that fig. 2 shows an air compressor included in the pneumatic transmission device, and a pneumatic mechanical device and the like, wherein the pneumatic mechanical device includes a mechanical arm, a pneumatic mechanical nozzle or the like for transmitting the SSD to be tested.

In practical use, the preset placing area and the test area are usually arranged in adjacent areas, that is, the SSD front end placing area shown in fig. 2, specifically, usually, the preset placing area and the test area are sequentially arranged from left to right in the SSD front end placing area, and in the test area, the first test fixture is placed on the left side of the second test fixture, so that the transmission device can transmit the SSD to be tested in the placing area to the neighboring first test fixture for fixing.

Further, fig. 3 shows a schematic diagram of an SSD to be tested in a placement area, specifically, the placement area is usually provided with a plurality of trays arranged according to a preset array for placing the SSD to be tested, fig. 4 further shows a schematic diagram of a structure of a first test fixture, specifically, fig. 4 shows a schematic diagram of the SSD to be tested fixed in the test slot, which includes a fixture process edge of the whole first test fixture, and a first test interface, specifically, the first test interface is a SATA (Serial ATA) interface. Fig. 5 is a schematic structural diagram of a second test fixture, specifically, fig. 5 is a schematic diagram illustrating connection between a second test interface and a test interface of a PC, in practical use, the second test fixture is generally arranged in multiple rows and multiple columns, the test interface of the PC generally includes an SATA data interface and an SATA power interface, and the first test interface and the second test interface are generally arranged in a form of a male socket and a female socket that are matched with each other, so as to establish electrical connection.

Specifically, based on the schematic diagrams shown in fig. 2 to 5, the automatic test system for an SSD according to the embodiment of the present invention includes the following processes before performing the SSD automatic test:

(1) the industrial personal computer is connected to the PLC equipment through a COM port or a USB port, automatic test software is installed in the industrial personal computer, after the software is opened, the PLC equipment can open a control valve circuit of pneumatic transmission equipment, and the pneumatic transmission equipment generally comprises an air source device consisting of an air compressor, an execution device of mechanical energy output by an air cylinder and a vacuum chuck, a control device for adjusting the pressure, flow and flowing direction of compressed air, and auxiliary devices such as line connection, sensor detection and the like;

(2) the PLC device fixes the SSD to be tested (i.e., the SSD to be tested shown in fig. 3) in the SSD front end placement region on the first test fixture shown in fig. 4 by controlling the movement of the pneumatic mechanical device and the pneumatic vacuum suction nozzle (e.g., the pneumatic mechanical suction nozzle, etc.), wherein, the first testing fixture shown in fig. 4 is usually a single-row fixing fixture, which is matched with the multi-row and multi-column interfaces shown in fig. 5, for example, in the first test fixture shown in fig. 4, the first test interface is a male socket, the second test interface in the second test fixture is a female socket, and so on, at this time, the second test interface in the second test fixture is mainly used for connecting with the male seat in the first test fixture, and, usually, the second test interface in the second test fixture is connected with the SATA data interface and SATA power interface outputted by each PC.

Further, the automatic test system of the SSD in the embodiment of the present invention is further configured with a high temperature test system connected to the PLC device; i.e., the high temperature test system 201 shown in fig. 2.

The second test fixture is generally arranged in an area corresponding to the high-temperature test system and used for performing high-temperature reliability test on the SSD to be tested under the control of the PLC equipment.

Specifically, the second test fixture is built in a high-temperature fixture of a high-temperature test system, and the high-temperature test system is controlled to be opened and closed by PL equipment, so that a high-temperature BIT test or a high-temperature RDT test can be conveniently performed on the SSD to be tested.

Further, before the SSD automatic test, the following steps are also included:

(3) after the SSD product to be tested is placed in the first test fixture, the PLC equipment can control the pneumatic control valve circuit of the corresponding pneumatic transmission equipment to push the first test fixture placed in a single row and a certain row of female socket interfaces in the second test fixtures in multiple rows and multiple columns to be connected, namely, the first test interface is mutually connected with the second test interface in one row to achieve the electric connection between the SSD to be tested and the PC.

(4) After the electric connection, a confirmation signal can be sent to the PLC equipment by the sensor of each test slot arranged in the test area, the confirmation signal is transmitted to the industrial personal computer by the PLC equipment, and after the industrial personal computer receives the confirmation signal, each PC in the PC equipment set is controlled by the local area network to open a pre-stored test algorithm so as to automatically test the SSD to be tested.

Further, as shown in fig. 2, the automatic test system for SSD according to the embodiment of the present invention is further configured with an automatic recovery device 202;

specifically, the PC is further used for sending a test failure signal to the industrial personal computer if the test failure signal is monitored in the automatic test process of the SSD to be tested; the industrial personal computer is also used for triggering the PLC equipment to control the transmission equipment to transmit the test SSD corresponding to the PC sending the failure signal to the automatic recovery device after receiving the failure signal.

In practical use, the automatic recovery device 202 is a recovery device for testing unqualified products, and considering that the testing process of the SSD usually has one testing algorithm, if a testing failure signal occurs in the execution process of any one testing algorithm during the testing process, it is indicated that the SSD to be tested is unqualified product.

Specifically, the pre-stored test algorithm in the PC includes at least one of the following test algorithms: presetting a logic card opening algorithm, a high-temperature reliability test algorithm and a normal-temperature test algorithm; therefore, the PC is also used for sending the test failure signal to the industrial personal computer if the test failure signal is monitored when any test algorithm is started; or in any card opening process corresponding to the card opening algorithm, if the test failure signal is monitored, the test failure signal is sent to the industrial personal computer.

Further, as shown in fig. 2, the automatic test system for an SSD according to the embodiment of the present invention is further configured with a good placement area 203; the PC is also used for sending a test completion signal to the industrial personal computer after the automatic test process of the SSD to be tested is finished; the industrial personal computer is also used for triggering the PLC equipment to control the transmission equipment to transmit the test SSD corresponding to the PC sending the test completion signal to the qualified product placing area after receiving the test completion signal.

Specifically, after the PC monitors that all test algorithms are executed, a test completion signal is sent to the industrial personal computer, which indicates that the SSD to be tested passes through the automatic execution process of this execution, so that the SSD to be tested can be transferred to the qualified product placement area.

Generally, the testing algorithm pre-stored in the PC includes a plurality of testing algorithms, such as a preset logic card-opening algorithm, a high-temperature reliability testing algorithm, a normal-temperature testing algorithm, and the like, and the preset logic card-opening algorithm generally refers to an SSD K1& K2& K3 card-opening algorithm for performing card-opening testing on the SSD.

In practical use, the SSD K1& K2& K3 card opening algorithm includes a K1 card opening process, a K2 card opening process and a K3 card opening process, which are usually performed alternately with other test processes.

Specifically, the K1 card opening process is usually used as a first process, in which the SSD to be tested with good appearance quality performs function detection and card opening, and the card opening process mainly inputs the data of the client to verify the read-write performance of the SSD. After the K1 card opening process is completed, the high temperature reliability test algorithm may be continuously executed, for example, after the K1 card opening process is completed, the SSD to be tested may automatically enter an RDT test stage, and usually, in the K1 card opening process, the PLC device may start the high temperature test system in advance, such as opening a high temperature furnace of the high temperature test system, so as to directly perform the high temperature reliability test after the K1 card opening process is completed. After the high-temperature reliability test is finished, the PLC equipment can trigger the high-temperature test system to be closed, the K2 card opening process can be started at the moment, secondary card opening is carried out, and after the secondary card opening is finished, the normal-temperature test algorithm is continuously executed, for example, the BIT test and the K3 card opening process are continuously carried out.

For convenience of understanding, fig. 6 shows a schematic test flow diagram of an automatic test system of an SSD, specifically, a card-open algorithm, a high-temperature reliability test algorithm, and a normal-temperature test algorithm for simultaneously storing preset logic in a PC are taken as an example for description, and as shown in fig. 6, the test flow diagram includes the following flows:

s1: starting an industrial personal computer, starting SSD automatic test software prestored in the industrial personal computer, and starting PLC equipment and a PC;

s2: the PLC equipment drives the transmission equipment to transmit the SSD to be tested to a first test fixture in a preset test area from a preset placing area, and the first test fixture and the second test fixture are used for realizing the electric connection between the SSD to be tested and the PC;

s3: the PC automatically starts a K1 card opening process;

specifically, after the K1 card opening process is started, the corresponding software is opened, and then the connected SSD to be tested is automatically browsed to perform a K1 card opening operation. At the moment, the PLC triggers the high-temperature test system to start, and the high-temperature reliability test is directly carried out after the K1 card opening process is finished.

S4: if the PC monitors that the K1 card opening process is abnormal, so that the card opening process fails, sending a test failure signal to the industrial personal computer, and controlling transmission equipment by PLC equipment to transmit a test SSD corresponding to the PC which sends the test failure signal to an automatic recovery device for recovery;

specifically, the industrial personal computer stores the identifier of each PC in advance, so that after the test failure signal is received, the specific to-be-tested SSD corresponding to which PC is abnormal can be determined according to the responded port and the identifier of the PC, and then the SSD is recovered.

S5: the K1 card opening process is completed, and the RDT test is automatically started;

the RDT test generally refers to a high-temperature RDT test, after the RDT test is completed, SSD automatic test software configured by an industrial personal computer judges the Bad Block information of each SSD disk to be tested according to log files of the open card software, automatically screens SSD to be tested with too many Bad blocks or Program Fail, and transmits screened unqualified products to an automatic recovery device for recovery.

After the RDT test is completed, the PC closes the K1 card opening process, runs the K2 card opening process, and closes the high-temperature test system through the PLC equipment before the K2 card opening process runs.

S6: starting a K2 card opening process:

specifically, the K2 card opening process is usually performed after performing the high/low temperature and aging tests, and at this time, a tester may generate a customized firmware specially used for the SSD to be tested by using the SSD basic information, the NAND ID, the cache chip (optional) and other information set by the user, and write the firmware into the main control ROM, and perform the verification and test of the firmware.

In the process, the K2 card opening software corresponding to the K2 card opening process performs a second card opening step on the SSD to be tested, and automatically initializes and formats the uninitialized disk under the disk management.

S7: after K2 opens the card, further BIT testing is performed;

generally, the BIT test at this time includes aging, power on/off, read/write speed test, hibernation, restart, vibration test, full disk detection, and the like, so as to ensure the accuracy of the test.

During actual use, the temperature of the BIT test can be high, namely, a high-temperature test system is started, normal-temperature test can also be performed, the SSD automatic test software configured by the industrial personal computer during the test can judge defective products through a Log file at the bottom layer of the BIT software, the judged defective products are transmitted to an automatic recovery device to be recovered, and after the test is completed, the PC can close K2 card opening software.

S8: running a K3 card opening process;

specifically, the K3 card opening software included in the K3 card opening process performs K3 step card opening on the SSD to be tested, and automatically initializes the uninitialized disk under disk management. The secondary card opening process is the last card opening test process of the whole automatic test process, the PLC equipment in the process can also transmit unqualified products which fail in test to the automatic recovery device for recovery, and control the air pressure control valve circuit of corresponding transmission equipment after the process is finished so as to push the first test fixture to be separated from the second test fixture; and after separation, classifying and placing the qualified products, the defective products or the unqualified products in each card opening working section.

S9: and after the test is finished, conveying the qualified products to a qualified product placing area for classified placement.

It should be understood that the first test fixture and the second test fixture are all fixtures for completing automatic tests, and are not limited to the shapes and the number of interfaces; the SSD automatic test software configured by the industrial personal computer is specially-made software for completing an SSD test process; the transmission equipment is a technology which takes compressed air as a power source to drive and control various mechanical equipment so as to realize mechanization and automation of the production process; the PC mainly refers to equipment such as a common personal computer, a notebook, other computers and the like; further, the SSD to be tested, as mentioned above, generally refers to various storage products using NAND FLASH as the storage medium, such as: SSD, mSATA, m.2(NGFF), PCIE, and the like, which are based on actual use conditions, and the embodiment of the present invention is not limited thereto.

In summary, according to the automatic testing system for the SSD provided by the embodiment of the present invention, after the operation software of the industrial personal computer is started, the SSD to be tested in the placement area can be automatically transferred to the testing jig, and the external PC and the PLC device are controlled according to the preset logic to drive the pneumatic transmission device to automatically complete all tests of the SSD to be tested, and the number of the SSDs to be tested can be determined by the number of the PC devices and the PLC devices, so that the whole SSD test does not need to be manually plugged and unplugged, and the cost loss in labor and time can be reduced.

Further, on the basis of the above embodiment, an embodiment of the present invention further provides an automatic testing method for an SSD, which is applied to the above automatic testing system for an SSD, specifically, as shown in fig. 7, a flowchart of the automatic testing method for an SSD, the method includes:

step S701, an industrial personal computer responds to starting operation of an automatic testing system acting on the SSD and sends a trigger signal to the PLC device so as to trigger the PLC device to control the transmission device to transmit the SSD to be tested to a preset testing area from a preset placing area, so that the SSD to be tested is electrically connected with the PC;

step S702, the PLC device monitors a confirmation signal of the SSD to be tested placed in the test area, and sends a connection instruction to the industrial personal computer after monitoring the confirmation signal;

step S703, the industrial personal computer is also used for sending a test instruction to at least one PC machine when receiving the connection instruction;

step S704, after receiving the test instruction, the PC starts a pre-stored test algorithm according to a preset test logic, so as to perform an automatic test on the SSD to be tested in the test area.

Further, the method further comprises: monitoring a test failure signal in the automatic test process of the SSD to be tested through the PC, and if the test failure signal is monitored, sending the test failure signal to the industrial personal computer; the industrial personal computer is further used for triggering the PLC equipment to control the transmission equipment to transmit the SSD to be tested corresponding to the PC which sends the test failure signal to the automatic recovery device after receiving the test failure signal.

The automatic testing method of the SSD provided by the embodiment of the invention has the same technical characteristics as the automatic testing system of the SSD provided by the embodiment, so that the same technical problems can be solved, and the same technical effects can be achieved.

The computer program product of the system and the method for automatically testing the SSD according to the embodiments of the present invention includes a computer readable storage medium storing a program code, where instructions included in the program code may be used to execute the method described in the foregoing method embodiments, and specific implementation may refer to the method embodiments, and will not be described herein again.

It can be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working process of the method described above may refer to the corresponding process in the foregoing embodiment, and is not described herein again.

In addition, in the description of the embodiments of the present invention, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases for those skilled in the art.

The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that the following embodiments are merely illustrative of the present invention, and not restrictive, and the scope of the present invention is not limited thereto: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the embodiments of the present invention, and they should be construed as being included therein. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.