1. The automatic device for the temperature brittleness test of the rubber support sample wafer is characterized by comprising a zooming camera (2), a storage plate (3), a rack (7) and a controller (8), wherein limiting supports (6) are mounted at two sides of the bottom of the rack (7), a crawler-type conveyor belt (21) is mounted inside the rack (7), a servo motor (22) is uniformly mounted at one end of the crawler-type conveyor belt (21), the storage plate (3) is uniformly fixed at the top of the crawler-type conveyor belt (21), a semiconductor refrigerating sheet (13) is uniformly mounted at the top end inside the storage plate (3), a temperature sensor (14) is mounted at one end inside the storage plate (3), a fan (16) is mounted at the bottom of the storage plate (3), the zooming camera (2) is mounted on the rack (7) above the storage plate (3), and a guide rail (9) is uniformly fixed on the rack (7) at one end of the zooming camera (2), the utility model discloses a zoom camera, including guide rail (9), driving plate (10) are installed to the one end that is close to zoom camera (2) in guide rail (9), and the bottom of driving plate (10) installs impact head (12), and the internally mounted of impact head (12) has pressure sensor (19), controller (8) are installed to the lateral wall of frame (7).

2. The automatic device for the temperature brittleness test of the rubber support sample wafer according to claim 1, wherein: first mount (1) is installed at the top of camera (2) zooms, and the top of first mount (1) evenly is provided with the screw of being connected with frame (7).

3. The automatic device for the temperature brittleness test of the rubber support sample wafer according to claim 2, wherein: the two sides of the zoom camera (2) are provided with damping rotating shafts between the two sides and the first fixing frame (1), and a turnover structure is formed between the zoom camera (2) and the first fixing frame (1).

4. The automatic device for the temperature brittleness test of the rubber support sample wafer according to claim 1, wherein: bond between putting thing board (3) and crawler-type conveyer belt (21), connecting cutting (17) have all been welded at the both ends at impact head (12) top, evenly be provided with on drive plate (10) with be connected cutting (17) assorted connecting slot (11), and the welding of one side of connecting cutting (17) has latch segment (18), is provided with the screw of being connected with drive plate (10) on latch segment (18).

5. The automatic device for the temperature brittleness test of the rubber support sample wafer according to claim 1, wherein: the number of the limiting supports (6) is 2, and fixing bolts (4) are arranged at two ends of each limiting support (6).

6. The automatic device for the temperature brittleness test of the rubber support sample wafer according to claim 1, wherein: the top of the limiting support (6) is fixed with a rubber cushion (5), and the rubber cushion (5) and the rack (7) are connected in a hot melting mode.

7. The automatic device for the temperature brittleness test of the rubber support sample wafer according to claim 1, wherein: the rack (7) is made of stainless steel, and a polysulfone rigid layer is arranged on the outer side wall of the rack (7).

8. The automatic device for the temperature brittleness test of the rubber support sample wafer according to claim 1, wherein: the number of the guide rails (9) is 2, and an integrated welding structure is formed between the guide rails (9) and the rack (7).

9. The automatic device for the temperature brittleness test of the rubber support sample wafer according to claim 1, wherein: the top end of the guide rail (9) is provided with a linear motor (901), the output end of the linear motor (901) is bonded with a sliding block (20), and the sliding block (20) and the driving plate (10) are bonded with each other.

10. The automatic device for the temperature brittleness test of the rubber support sample wafer according to claim 1, wherein: the bottom welding of fan (16) has second mount (15), and the top of second mount (15) evenly is provided with the screw of being connected with putting thing board (3).

Background

Rubber support uses extensively on various electrical equipment, it generally possesses antiskid and buffering absorbing advantage, and in order to guarantee rubber support's performance, rubber support is when processing preparation, just need to use an automatics who is used for rubber support sample piece temperature fragility test to detect it, but the automatics who is used for rubber support sample piece temperature fragility test that has now still exists when in-service use such as not setting up impact device and sample piece conveyer, a plurality of sample pieces of difficult continuous test, the experimental impact process of difficult camera record sample piece of utilizing, the fragility degree of inconvenient analysis sample piece, defects such as difficult operation, this is unfavorable for the long-term popularization of device.

Disclosure of Invention

The invention aims to provide an automatic device for a temperature brittleness test of a rubber support sample wafer, which solves the problems that an impact device and a sample wafer conveying device are not arranged, a plurality of sample wafers are difficult to test continuously, the impact process of the sample wafer test is difficult to record by a camera, the brittleness degree of the sample wafer is inconvenient to analyze and record, and the operation is difficult.

In order to achieve the purpose, the invention provides the following technical scheme: an automatic device for a temperature brittleness test of a rubber support sample wafer comprises a zoom camera, a storage plate, a frame and a controller, wherein two sides of the bottom of the frame are provided with limit supports, and a crawler belt conveyor is arranged in the frame, one end of the crawler belt conveyor is uniformly provided with a servo motor, the top of the crawler belt conveyor is uniformly fixed with a storage plate, the top end of the interior of the object placing plate is uniformly provided with semiconductor refrigerating sheets, one end of the interior of the object placing plate is provided with a temperature sensor, a fan is arranged at the bottom of the object placing plate, a zoom camera is arranged on the rack above the object placing plate, guide rails are uniformly fixed on the rack at one end of the zoom camera, a driving plate is arranged at one end of each guide rail close to the zoom camera, and the bottom of drive plate installs the impact head, and the internally mounted of impact head has pressure sensor, the lateral wall of frame is installed the controller.

Preferably, a first fixing frame is installed at the top of the zoom camera, and screws connected with the frame are uniformly arranged at the top of the first fixing frame, so that dynamic changes of brittleness in the detection process of the rubber support can be conveniently recorded and displayed.

Preferably, the damping rotating shaft is arranged between each of two sides of the zooming camera and the first fixing frame, and the overturning structure is formed between the zooming camera and the first fixing frame, so that a user can conveniently adjust the use angle of the zooming camera.

Preferably, constitute and bond between thing board and the crawler-type conveyer belt, the both ends of strikeing the overhead portion all weld and connect the cutting, evenly be provided with on the drive plate with connect cutting assorted connection slot, and the one side welding of connecting the cutting has the stay, is provided with the screw of being connected with the drive plate on the stay, makes its convenient to use person will strike the head and carry out the dismouting on the drive plate.

Preferably, the number of the limiting supports is 2, and the two ends of each limiting support are provided with fixing bolts, so that a user can conveniently fix and install the device on a suitable operation table.

Preferably, the top of spacing support is fixed with rubber buffer, constitutes hot melt connection between rubber buffer and the frame, makes it promote the shock attenuation shock-absorbing capacity of device, has strengthened the steady effect of device.

Preferably, the rack is made of stainless steel, and a polysulfone rigid layer is arranged on the outer side wall of the rack, so that the structure of the device is optimized, and the structural strength of the rack is enhanced.

Preferably, the guide rail is provided with 2, constitutes integrated welded structure between guide rail and the frame, makes it promote the fastness performance of device overall structure through the welding.

Preferably, a linear motor is installed at the top end of the guide rail, a sliding block is bonded to the output end of the linear motor, and bonding is formed between the sliding block and the driving plate, so that the stability between the sliding block and the driving plate is improved through bonding.

Preferably, the bottom welding of fan has the second mount, and the top of second mount evenly is provided with and puts the screw that the thing board is connected, makes it can promote device's refrigeration effect.

Compared with the prior art, the invention has the beneficial effects that:

(1) the automatic device for the temperature brittleness test of the rubber support sample wafer optimizes the structure of the device by installing the impact head, the driving plate, the connecting inserting strip and the connecting inserting slot, when in use, on one hand, a user can use the connecting action of the first fixing frame and the screw to disassemble and assemble the zooming camera on the device, and on the other hand, the user can utilize the inserting connecting structure formed by the connecting inserting strip and the connecting inserting slot to cooperate with the locking sheet and the locking fixing action of the screw to disassemble and assemble the impact head on the driving plate by arranging the damping rotating shaft between the two sides of the zooming camera and the first fixing frame so as to adjust the using angle of the zooming camera and improve the detection effect on the deformation condition, and on the other hand, the user can utilize the linear motor to drive the sliding block and the impact head installed with the sliding block to fall down, the weight can descend faster, so that the impact force of the impact device is larger, the test effect is improved by arranging the impact device, in addition, during the specific test, rubber supports to be tested are sequentially placed on the object placing plates, the servo motor is started to drive the crawler-type conveyor belt to rotate, so that the object placing plates bonded on the crawler of the crawler-type conveyor belt are conveyed forwards, sample wafers placed on the object placing plates are sequentially conveyed forwards, the test is sequentially carried out, and the working efficiency of the device is improved by arranging the sample wafer conveying device;

(2) the automatic device for the temperature brittleness test of the rubber support sample wafer is provided with the semiconductor refrigeration sheets, the object placing plate, the zooming camera and the frame, so that the device optimizes the performance of the device, when in use, on one hand, two semiconductor refrigeration sheets are uniformly arranged in the object placing plate, the refrigeration end of one semiconductor refrigeration sheet is aligned to the top of the object placing plate, and the heating end of the other semiconductor refrigeration sheet is aligned to the top of the object placing plate, when in specific operation, the controller is utilized to control the heating end to be aligned to the semiconductor refrigeration sheet at the top of the object placing plate for electrifying, the rubber support arranged at the top of the object placing plate can be heated, in addition, the controller is utilized to control the refrigeration end to be aligned to the semiconductor refrigeration sheet at the top of the object placing plate for electrifying, the rubber support arranged at the top of the object placing plate can be refrigerated, and the temperature monitoring function of the temperature sensor is matched, therefore, the device optimizes the temperature regulation function, is convenient for heating and refrigerating, and is also convenient for accurately regulating and controlling the heating and refrigerating temperature of the object placing plate, thereby improving the temperature regulation and control range and the accuracy of the temperature brittleness test of the rubber support, on the other hand, the zoom camera matched with the object placing plate is arranged on the rack, the camera can be used for shooting the rubber support tested and detected on the object placing plate, and the monitored data is sent to the controller and the industrial computer connected with the controller, the deformation condition of the rubber support is conveniently amplified and visually displayed on the screen of the industrial computer by utilizing the image amplification function of the zoom camera, thereby being convenient for recording and displaying the dynamic change of brittleness in the detection process of the rubber support, and the temperature sensor and the pressure sensor monitor the temperature data and the pressure data applied to the rubber support, the temperature and pressure change information is sent to a controller and an industrial computer, so that the change information can be conveniently recorded by a display screen on the industrial computer and visually displayed, and the observation and the recording of an experimental result are further facilitated;

(3) the automatic device for the temperature brittleness test of the rubber support sample wafer is provided with the semiconductor refrigeration wafer, the object placing plate, the fan and the rubber buffer cushion, so that when the device is actually used, on one hand, the fan is arranged on the object placing plate below the semiconductor refrigeration wafer, when the object placing plate is subjected to refrigeration treatment, the fan is started to dissipate heat, the refrigeration effect of the device can be improved, the situation that the refrigeration effect is influenced by poor heat dissipation of a corresponding heating end when the refrigeration end of the semiconductor refrigeration wafer operates is avoided, on the other hand, a user can fixedly install the device on a proper operation table top by utilizing the effects of the two limiting supports and the fixing bolts arranged on the limiting supports, the stability of the device is enhanced, and the damping and buffering performance of the device is improved by utilizing the elastic buffering effect of rubber due to the rubber buffer cushion arranged between the limiting supports and the frame, the smoothing effect of the device is enhanced.

Drawings

FIG. 1 is a schematic front view of the present invention;

FIG. 2 is a schematic rear view of a cross-sectional structure of the shelf of the present invention;

FIG. 3 is a schematic structural view of the front section of the impact head according to the present invention;

FIG. 4 is a schematic side sectional view of the guide rail of the present invention;

FIG. 5 is a block diagram of the system of the present invention.

In the figure: 1. a first fixing frame; 2. a zoom camera; 3. a storage plate; 4. fixing the bolt; 5. a rubber cushion pad; 6. a limiting support; 7. a frame; 8. a controller; 9. a guide rail; 901. a linear motor; 10. a drive plate; 11. connecting the slots; 12. an impact head; 13. a semiconductor refrigeration sheet; 14. a temperature sensor; 15. a second fixing frame; 16. a fan; 17. connecting the inserting strips; 18. a locking piece; 19. a pressure sensor; 20. a slider; 21. a crawler belt; 22. a servo motor.

Detailed Description

The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1-5, an embodiment of the present invention is shown: an automatic device for a temperature brittleness test of a rubber support sample wafer comprises a zoom camera 2, a storage plate 3, a rack 7 and a controller 8, wherein two sides of the bottom of the rack 7 are respectively provided with a limiting support 6, a crawler belt 21 is arranged in the rack 7, one end of the crawler belt 21 is uniformly provided with a servo motor 22, the top of the crawler belt 21 is uniformly fixed with the storage plate 3, the top end of the interior of the storage plate 3 is uniformly provided with a semiconductor refrigerating sheet 13, one end of the interior of the storage plate 3 is provided with a temperature sensor 14, the bottom of the storage plate 3 is provided with a fan 16, the rack 7 above the storage plate 3 is provided with the zoom camera 2, the rack 7 at one end of the zoom camera 2 is uniformly fixed with a guide rail 9, one end of the guide rail 9 close to the zoom camera 2 is provided with a drive plate 10, and the bottom of the drive plate 10 is provided with an impact head 12, a pressure sensor 19 is arranged inside the impact head 12, and a controller 8 is arranged on the outer side wall of the frame 7;

the top of the zoom camera 2 is provided with a first fixing frame 1, and the top of the first fixing frame 1 is uniformly provided with screws connected with a frame 7;

when the device is used, on one hand, the zoom camera 2 matched with the object placing plate 3 is installed on the rack 7, the camera can be used for shooting a rubber support subjected to test detection on the object placing plate 3, monitored data are sent to the controller 8 and an industrial computer connected with the controller 8, the deformation condition of the rubber support can be conveniently amplified and visually displayed on a screen of the industrial computer by using the image amplification function of the zoom camera 2, and further the dynamic change of brittleness in the detection process of the rubber support can be conveniently recorded and displayed, and on the other hand, a user can use the connection effect of the first fixing frame 1 and a screw to disassemble, assemble and maintain the zoom camera 2 on the device;

damping rotating shafts are arranged between the two sides of the zoom camera 2 and the first fixing frame 1, and a turnover structure is formed between the zoom camera 2 and the first fixing frame 1;

when the device is used, the damping rotating shafts are arranged between the two sides of the zoom camera 2 and the first fixing frame 1, so that a user can conveniently adjust the use angle of the zoom camera 2, and the detection effect on the deformation condition is improved;

the object placing plate 3 and the crawler-type conveyor belt 21 are bonded, connecting inserting strips 17 are welded at two ends of the top of the impact head 12, connecting slots 11 matched with the connecting inserting strips 17 are uniformly formed in the driving plate 10, a locking sheet 18 is welded at one side of each connecting inserting strip 17, and screws connected with the driving plate 10 are arranged on the locking sheets 18;

when the impact head driving device is used, a user can use the inserting connection structure formed by the connecting inserting strips 17 and the connecting inserting grooves 11 to match with the locking and fixing functions of the locking pieces 18 and the screws to disassemble and assemble the impact head 12 on the driving plate 10, so that the user can conveniently maintain the structure of the impact head 12;

2 limiting supports 6 are arranged, and two ends of each limiting support 6 are provided with fixing bolts 4;

when in use, a user can fixedly install the device on a proper operation table top by utilizing the action of the two limiting supports 6 and the fixing bolts 4 arranged on the two limiting supports, so that the stability of the device is enhanced;

the top of the limit support 6 is fixed with a rubber cushion 5, and the rubber cushion 5 and the frame 7 form hot melt connection;

when the device is used, the rubber buffer cushion 5 is arranged between the limiting support 6 and the rack 7, and the elastic buffering effect of rubber is utilized, so that the damping and buffering performance of the device is improved, and the stable effect of the device is enhanced;

the frame 7 is made of stainless steel, and a polysulfone rigid layer is arranged on the outer side wall of the frame 7;

the structure of the device is optimized, and the structural strength of the frame 7 is enhanced;

2 guide rails 9 are arranged, and an integrated welding structure is formed between the guide rails 9 and the rack 7;

the firmness of the whole structure of the device is improved by welding;

a linear motor 901 is installed at the top end of the guide rail 9, a sliding block 20 is bonded at the output end of the linear motor 901, and bonding is formed between the sliding block 20 and the driving plate 10;

when the impact device is used, on one hand, the stability between the sliding block 20 and the driving plate 10 is improved through bonding, on the other hand, the linear motor 901 is used for driving the sliding block 20 and the impact head 12 installed with the sliding block 20 to fall, so that the falling speed of a heavy object can be higher, the impact force of the impact device is larger, and the test effect is improved;

a second fixing frame 15 is welded at the bottom of the fan 16, and screws connected with the object placing plate 3 are uniformly arranged at the top of the second fixing frame 15;

when in use, on one hand, two semiconductor refrigerating sheets 13 are uniformly arranged in the object placing plate 3, the refrigerating end of one semiconductor refrigerating sheet 13 is aligned to the top of the object placing plate 3, and the heating end of the other semiconductor refrigerating sheet 13 is aligned to the top of the object placing plate 3, during the specific operation, the controller 8 is used for controlling the heating end to be aligned to the semiconductor refrigerating sheet 13 at the top of the object placing plate 3 to be electrified, so that a rubber support arranged at the top of the object placing plate 3 can be heated, in addition, the controller 8 is used for controlling the refrigerating end to be aligned to the semiconductor refrigerating sheet 13 at the top of the object placing plate 3 to be electrified, so that the rubber support arranged at the top of the object placing plate 3 can be refrigerated, and the temperature monitoring function of the temperature sensor 14 is matched, so that the temperature adjusting function of the device is optimized, the heating and refrigerating are convenient, and the heating and refrigerating temperatures of the object placing plate 3 are accurately adjusted and controlled, furthermore, the temperature regulation range and the accuracy of the temperature brittleness test of the rubber support are improved, meanwhile, the fan 16 is arranged on the object placing plate 3 below the semiconductor refrigerating sheet 13, when the object placing plate 3 is subjected to refrigerating treatment, the fan 16 is started to dissipate heat, the refrigerating effect of the device can be improved, the situation that the refrigerating effect is influenced by the heating end corresponding to the semiconductor refrigerating sheet 13 due to poor heat dissipation when the refrigerating end of the semiconductor refrigerating sheet is operated is avoided, and on the other hand, a user can use the connecting action of the second fixing frame 15 and the screw to disassemble and assemble the fan 16 on the object placing plate 3, so that the fan 16 can be maintained and replaced conveniently;

the output ends of the temperature sensor 14 and the pressure sensor 19 are respectively and electrically connected with the input end of the controller 8 through leads, the output end of the controller 8 is respectively and electrically connected with the input ends of the linear motor 901, the servo motor 22, the semiconductor refrigeration piece 13 and the fan 16 through leads, the zoom camera 2 is bidirectionally and electrically connected with the controller 8 through leads, the model of the controller 8 can be FX1S-20MR-D, the model of the semiconductor refrigeration piece 13 can be TEC1-12705, the model of the fan 16 can be DC6025, the model of the pressure sensor 19 can be WF5803F, the model of the temperature sensor 14 can be WRM-101, and the model of the servo motor 22 can be EDSMT-2T.

The working principle is as follows: when the device is used, the external power supply is connected, a user can utilize the action of the two limiting supports 6 and the fixing bolts 4 arranged on the limiting supports to fixedly install the device on a proper operation table surface, so that the stability of the device is enhanced, then rubber supports to be tested are sequentially placed on the object placing plates 3, the servo motor 22 is started to drive the crawler type conveyor belt 21 to rotate, each object placing plate 3 bonded on a crawler of the crawler type conveyor belt 21 is conveyed forwards, sample plates placed on the object placing plates 3 are sequentially conveyed forwards, tests are sequentially carried out, further, by arranging an automatic conveying structure, the working efficiency of the device is improved, meanwhile, two semiconductor refrigerating plates 13 are uniformly arranged in the object placing plates 3, the refrigerating end of one semiconductor refrigerating plate 13 is aligned to the top of the object placing plate 3, and the heating end of the other semiconductor refrigerating plate 13 is aligned to the top of the object placing plate 3, during the operation, the controller 8 is used for controlling the heating end to be electrified with the semiconductor refrigerating sheet 13 at the top of the object placing plate 3, the rubber support at the top of the object placing plate 3 can be heated, in addition, the controller 8 is used for controlling the refrigerating end to be electrified with the semiconductor refrigerating sheet 13 at the top of the object placing plate 3, the rubber support at the top of the object placing plate 3 can be refrigerated, and the temperature monitoring function of the temperature sensor 14 is matched, so that the temperature adjusting function of the device is optimized, the heating and refrigerating are convenient, the heating and refrigerating temperatures of the object placing plate 3 are convenient to accurately adjust and control, the temperature adjusting range and the accuracy of the temperature brittleness test of the rubber support are further improved, meanwhile, the fan 16 is arranged on the object placing plate 3 below the semiconductor refrigerating sheet 13, and when the object placing plate 3 is refrigerated, the fan 16 is started for heat dissipation, the refrigeration effect of the device can be improved, the situation that the refrigeration effect is influenced by poor heat dissipation of a heating end corresponding to a semiconductor refrigeration piece 13 when the refrigeration end of the semiconductor refrigeration piece is operated is avoided, finally, a linear motor 901 on a guide rail 9 is started, a sliding block 20 and an impact head 12 installed with the sliding block are driven by the linear motor 901 to fall, the falling speed of a heavy object can be increased, the impact force of the impact device is increased, the test effect is improved, meanwhile, on one hand, a zoom camera 2 matched with an object placing plate 3 is installed on a rack 7, the rubber support tested and detected on the object placing plate 3 can be shot by the camera, the monitored data is sent to a controller 8 and an industrial computer connected with the controller, and the deformation condition of the rubber support can be conveniently amplified and visually displayed on an industrial computer screen by the image amplification function of the zoom camera 2, and then be convenient for record and show the dynamic change of the fragility in the rubber support testing process, on the other hand temperature data and the pressure data of applying for the rubber support that temperature sensor 14 and pressure sensor 19 monitored can be sent to controller 8 and industrial computer, the change condition of the display screen record and the directly perceived demonstration temperature and pressure of being convenient for on the industrial computer, and then be convenient for the observation and the record of experimental result.