1. A durable burn-in load test system, comprising a load test cabinet and a high temperature test chamber, wherein:

placing a product to be tested in the high-temperature test box so as to control the environmental temperature of the product to be tested through the high-temperature test box;

the load value output by the load port on the load test cabinet can be adjusted;

and the product to be tested is electrically connected with the load port on the loading test cabinet, so that the product to be tested is controlled in a loading mode through the load value output by the load port.

2. The system of claim 1, wherein the load test cabinet is electrically connected to a control host to adjust a load value output from a load port on the load test cabinet via the control host.

3. The system according to claim 1 or 2, wherein the loading test cabinet comprises a main controller, a host interface and a debugging serial port; the main controller is electrically connected with the control host through the host interface, and the main controller is electrically connected with the product to be tested through the debugging serial port.

4. The system of claim 3, wherein the control host sets load values of each group of load ports on the loading test cabinet through the main controller according to preconfigured load information, and the control host maintains real-time communication with the product to be tested through the main controller when the product to be tested is connected with the debugging serial port.

5. The system of claim 1 or 2, wherein the load ports comprise a digital output port and a pulse width modulation port; accordingly, the load value comprises a digital output value delivered by the digital output port and a pulse width modulation signal with an adjustable duty ratio value delivered by the pulse width modulation port.

6. The system according to claim 1 or 2, wherein the load test cabinet comprises a plurality of groups of load ports, and each group of load ports is connected to a corresponding product to be tested, so that the load test cabinet performs batch load tests on a plurality of products to be tested at the same time.

7. The system of claim 1 or 2, wherein the back of the load testing cabinet adopts a heat dissipation structure with air blowing and air suction channels.

8. A method for endurance aging load testing for use in the system of any one of claims 1 to 7, the method comprising:

reading load information configured in advance for a product to be tested, and adjusting load values output by each group of load ports on a load test cabinet based on the load information;

and carrying out load control on the product to be tested by using the load value, and setting the environmental temperature of the product to be tested in a high-temperature test box so as to carry out load test on the product to be tested in the environmental temperature according to the load value.

9. The method of claim 8, further comprising:

determining a first acceleration factor of the product to be tested in an idle state and a second acceleration factor of the product to be tested in a loaded state;

determining a first actual test duration of the product to be tested in an idle state according to a target test duration, the number of the products to be tested and the first acceleration factor;

and determining a second actual test time length of the product to be tested in the loading state according to the target test time length, the number of the products to be tested and the second acceleration factor.

10. The method of claim 9, wherein the first acceleration factor and the second acceleration factor are each calculated according to the following formula:

wherein A is_fRepresents the first acceleration factor or the second acceleration factor, E_aDenotes the activation energy constant, K denotes the Boltzmann constant, T_uRepresents the ambient temperature, T_tAnd the test temperature of the product to be tested in an unloaded state or in a loaded state is represented.

11. Method according to claim 9 or 10, characterized in that the first actual test duration and the second test duration are calculated according to the following formula:

wherein, T_{Fruit of Chinese wolfberry}Representing the first actual test duration or the second actual test duration, T_TargetRepresents the target test duration, A_fRepresenting the first acceleration factor or the second acceleration factor, N representing the number of the products to be tested.

Background

The endurance aging test is a necessary process before the product is put into use, and the traditional endurance aging test method has a long period and cannot meet the requirement of rapid development of the current industry. In view of the above, there is a need for a method that can shorten the endurance aging test time and achieve the same aging effect in a relatively short test period.

At present, a commonly used method for testing the endurance aging is to dynamically change the duty ratio of a Pulse Width Modulation (PWM) signal, so as to adjust the load of a product to be tested. However, the conventional method for changing the duty ratio of the PWM signal is simple, and cannot shorten the period of the endurance aging test particularly well.

Disclosure of Invention

The invention provides a durable aging loading test system and a durable aging loading test method, which can improve the efficiency of durable aging test and further greatly shorten the test period.

In order to solve the above problems, an aspect of the present invention provides a durable aging loading test system, which includes a loading test cabinet and a high temperature test chamber, wherein: placing a product to be tested in the high-temperature test box so as to control the environmental temperature of the product to be tested through the high-temperature test box; the load value output by the load port on the load test cabinet can be adjusted; and the product to be tested is electrically connected with the load port on the loading test cabinet, so that the product to be tested is controlled in a loading mode through the load value output by the load port.

In one embodiment, the load test cabinet is electrically connected to a control host, so that the control host can adjust a load value output from a load port of the load test cabinet.

In one embodiment, the load test cabinet comprises a main controller, a host interface and a debugging serial port; the main controller is electrically connected with the control host through the host interface, and the main controller is electrically connected with the product to be tested through the debugging serial port.

In one embodiment, the control host sets load values of each group of load ports on the load test cabinet through the main controller according to preconfigured load information, and when the product to be tested is connected with the debugging serial port, the control host keeps real-time communication with the product to be tested through the main controller.

In one embodiment, the load ports include a digital output port and a pulse width modulation port; accordingly, the load value comprises a digital output value delivered by the digital output port and a pulse width modulation signal with an adjustable duty ratio value delivered by the pulse width modulation port.

In order to solve the above problem, another aspect of the present invention further provides a method for testing endurance aging loading, the method comprising: reading load information configured in advance for a product to be tested, and adjusting load values output by each group of load ports on a load test cabinet based on the load information; and carrying out load control on the product to be tested by using the load value, and setting the environmental temperature of the product to be tested in a high-temperature test box so as to carry out load test on the product to be tested in the environmental temperature according to the load value.

In one embodiment, the method further comprises: determining a first acceleration factor of the product to be tested in an idle state and a second acceleration factor of the product to be tested in a loaded state; determining a first actual test duration of the product to be tested in an idle state according to a target test duration, the number of the products to be tested and the first acceleration factor; and determining a second actual test time length of the product to be tested in the loading state according to the target test time length, the number of the products to be tested and the second acceleration factor.

In one embodiment, the first acceleration factor and the second acceleration factor are each calculated according to the following formula:

wherein A is_fRepresents the first acceleration factor or the second acceleration factor, E_aDenotes the activation energy constant, K denotes the Boltzmann constant, T_uRepresents the ambient temperature, T_tAnd the test temperature of the product to be tested in an unloaded state or in a loaded state is represented.

In one embodiment, the first actual test duration and the second test duration are calculated according to the following formulas:

wherein, T_{Fruit of Chinese wolfberry}Representing the first actual test duration or the second actual test duration, T_TargetRepresents the target test duration, A_fRepresenting the first acceleration factor or the second acceleration factor, N representing the number of the products to be tested.

The invention has the following advantages:

according to the technical scheme provided by the embodiment of the application, the loading test cabinet and the high-temperature test chamber can be adopted to carry out the durable aging test on the product to be tested, so that the aging speed of the product to be tested is increased, and the period of the durable aging test is shortened. Specifically, the product to be tested can be placed in the high-temperature test box, and the product to be tested can be electrically connected with the load port on the load test cabinet. The loading test cabinet can be connected with the control host, and the load value output by the load port can be adjusted through the control host, so that a product to be tested is placed in different load states for testing.

In the test process, the back of the loading test cabinet adopts a heat dissipation structure with air blowing and air suction channels, so that the ambient temperature of a product to be tested can be maintained within a proper range. The product that awaits measuring can be through debugging the serial ports with main control unit electric connection in the loading test cabinet, simultaneously, the main control unit can be through host computer interface and main control unit electric connection, like this, the main control unit just can real time communication with the product that awaits measuring, and the main control unit can adjust and control the state of the product that awaits measuring in real time alone. In addition, the control host can also set the load value of each group of load ports on the loading test cabinet according to the preconfigured load information, so that the global control of each product to be tested is realized.

Subsequently, the acceleration factors are respectively calculated for the no-load state and the loaded state of the product to be tested, so that the respective actual test duration of the no-load state and the loaded state can be determined. By comparing the actual test duration, the duration of the shortened endurance aging test can be determined.

Therefore, through the technical scheme provided by the application, the product to be tested can be subjected to single-path control or global control, and loading test and high-temperature test can be provided at the same time, so that the aging effect is improved. The specific shortened time length can be detected by calculating the actual test time length subsequently, so that the purpose of the endurance aging test is achieved, and the result of the endurance aging test can be evaluated.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.

FIG. 1 illustrates a schematic structural diagram of a durable aging loading test system according to an embodiment of the present application;

FIG. 2 is a schematic diagram illustrating a loading test cabinet according to an embodiment of the present application;

FIG. 3 shows a flow diagram of a method for endurance aging load testing in one embodiment of the present application.

Description of reference numerals: the method comprises the following steps of 1-loading a test cabinet, 2-high-temperature test box, 3-control host, 11-main controller, 12-host interface, 13-debugging serial port, 14-power distribution unit, 15-direct current power module, 16-heat dissipation circulation system, 17-power consumption unit, 18-electromagnetic valve output unit, 19-direct current power anode and 20-direct current power cathode.

Detailed Description

The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

In addition, the technical features involved in the different embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

Referring to fig. 1, the system may include a load test cabinet 1 and a high temperature test chamber 2. As shown in fig. 1, a product to be tested (not shown) may be placed in the high temperature test chamber 2, and the temperature in the high temperature test chamber may be adjusted, so that the ambient temperature of the product to be tested may be controlled. The product to be tested can be connected to the loading test cabinet 1 through the test wire harness, and thus, the loading test cabinet 1 can adjust the load parameters of the product to be tested.

Specifically, the adjustment process of the load parameter can be realized by the cooperative operation of the control host 3 and the loading test cabinet 1. In practical applications, the control host 3 may be a device with data processing function, for example, the control host 3 may be a notebook computer, a desktop computer, a workstation, or the like. The control host 3 is electrically connected with the loading test cabinet 1, so that the load values output by each group of load ports on the loading test cabinet can be adjusted. The load value output by the load port can carry out load control on the product to be tested.

In a specific application example, referring to fig. 2, the load test cabinet 1 may include a main controller 11, a host interface 12, and a debug serial port 13. The control host 3 may be electrically connected to the main controller 11 through a host interface 12, and the host interface 12 may be a USB interface, for example. Of course, with the development of the technology and the difference of the application scenarios, the host interface 12 may also be a VGA interface, an HDMI interface, etc., which is not limited in this application as long as the control host 3 can establish an electrical connection through the host interface 12 and the main controller 11.

In this application example, the main controller 11 may be electrically connected to the product to be tested through the debug serial port 13. The debug serial port 13 may be, for example, a CAN (Controller Area Network) bus interface. In this way, the main controller 11 serves as a bridge to establish communication connection between the control host 3 and the product to be tested, so that real-time communication is performed between the control host 3 and the product to be tested. For example, the control host 3 may monitor the operation state of the product to be tested, and may flexibly adjust the load parameter of the product to be tested.

In practical application, two CAN bus interfaces CAN be reserved in the loading test cabinet 1, and CAN be a high-speed CAN bus interface and a low-speed CAN bus interface, wherein the high-speed CAN bus interface CAN be used for normal data communication, and the low-speed CAN bus interface CAN ensure that the communication of the CAN bus CAN be continued when the connection of the CAN bus fails. Through two reserved CAN bus interfaces, a stable communication process between the loading test cabinet 1 and a product to be tested CAN be ensured.

In a specific application example, the control host 3 can control the operation state of the product to be tested through software installed inside, can also adjust the operation parameters of the product to be tested, and can collect the test data of the product to be tested. Before the endurance burn-in test is started, load information, which may include respective load parameters of respective products to be tested, may be configured in the control host 3. According to the load information, the control host 3 can set the load value of each group of load ports on the loading test cabinet 1 after establishing communication connection with the loading test cabinet 1. Therefore, when the load port is connected with the corresponding product to be tested through the test wire harness, the load value output by the load port can be transmitted to the product to be tested, and the product to be tested is controlled in an on-load mode.

Referring to fig. 2, each set of load ports on the load test cabinet 1 may include a Digital Output (DO) port and a Pulse Width Modulation (PWM) port. The load value output by the load port to the product to be tested can comprise a digital output value transmitted by the DO port and a pulse width modulation signal with adjustable duty ratio value transmitted by the PWM port. In this way, the control host 3 can globally set the load states of a plurality of products to be tested through the preconfigured load information. The load test cabinet 1 may include a plurality of groups of load ports, and each group of load ports may be connected to a corresponding product to be tested, so that the load test cabinet 1 may perform batch load tests on a plurality of products to be tested at the same time. For example, in a specific application example, the load test cabinet 1 may be configured with 40 PWM ports and 40 DO ports, so that the endurance aging test can be performed on a large number of products to be tested at the same time, and the efficiency of the endurance aging test is further improved.

It should be noted that the above load value is only one implementation manner in a specific application scenario, and those skilled in the art should understand that the set load value may be various. For example, in addition to varying the duty cycle value of the PWM signal, the load value may be adjusted by varying the thyristor conduction angle. Therefore, the present application is not limited to the specific implementation of the load value.

In practical application, the load port can realize global setting of the product to be tested, and the debugging serial port 13 can realize real-time control of a single product to be tested. Therefore, the process of the endurance aging test can be more flexible through a dual control mode of single-path control and global control.

When the load value of the product to be tested is set in the load test cabinet 1, the heat dissipation of the load test cabinet is increased along with the increase of the set load value. In order to improve the heat dissipation efficiency of the loading test cabinet 1, in a specific application example, the back of the loading test cabinet may adopt a heat dissipation structure with air blowing and sucking channels, so as to ensure that the temperature of the loading test cabinet 1 may be kept below 35 ℃ in the durable aging test process.

In the internal structure of the load test cabinet 1 shown in fig. 2, conventional components may be included in addition to the above-described components. For example, the power distribution unit 14, the dc power module 15, the heat dissipation circulation system 16, the power consumption unit 17, the solenoid valve output unit 18, the dc power positive electrode 19, and the dc power negative electrode 20 may be included. The power distribution unit 14 can be connected to 220V or 360V ac power, the dc power module 15 can convert the ac power into 0-36V dc power, and the positive electrode 19 of the dc power and the negative electrode 20 of the dc power can supply power to the product to be tested. The heat dissipation circulation system 16 can dissipate heat inside the load testing cabinet 1. The power dissipation unit 17 may be a resistor in practical applications, and the solenoid output unit 18 may control the switching amount of the DO port.

In one embodiment, a method for endurance aging load testing applied to the system can also be provided. Referring to fig. 3, the method may include the following steps.

S1: and reading load information configured in advance for a product to be tested, and adjusting load values output by each group of load ports on the loading test cabinet based on the load information.

S2: and carrying out load control on the product to be tested by using the load value, and setting the environmental temperature of the product to be tested in a high-temperature test box so as to carry out load test on the product to be tested in the environmental temperature according to the load value.

For specific implementation of the above steps, reference may be made to the description in the foregoing embodiments, and details are not repeated here.

After providing the durable aging loading test system, an embodiment of the present application may further evaluate the test effect. Specifically, a first acceleration factor of the product to be tested in an unloaded state and a second acceleration factor of the product to be tested in a loaded state can be determined. Then, a first actual test duration of the product to be tested in the no-load state can be determined according to a target test duration, the number of the products to be tested and the first acceleration factor, and a second actual test duration of the product to be tested in the loaded state can be determined according to the target test duration, the number of the products to be tested and the second acceleration factor.

Specifically, the first acceleration factor and the second acceleration factor may each be calculated according to the following formula:

wherein A is_fRepresents the first acceleration factor or the second acceleration factor, E_aThe activation energy constant can be 0.67eV, K represents Boltzmann constant and can be 0.00008617eV/K, and T_uRepresents the ambient temperature, T_tThe temperature measurement device represents a test temperature of the product to be tested in an unloaded state or a test temperature of the product to be tested in a loaded state, and the environment temperature and the test temperature may be kelvin temperatures.

Wherein the first actual test duration and the second test duration may be calculated according to the following formulas:

wherein, T_{Fruit of Chinese wolfberry}Representing the first actual test duration or the second actual test duration, T_TargetRepresents the target test duration, A_fRepresenting the first acceleration factor or the second acceleration factor, N representing the number of the products to be tested.

In a specific application example, with 50000 hours as a target test duration, 2 products to be tested can be tested for the same product, and the ambient temperature may be 273+ 30K. In the unloaded state, the test temperature may be 273+ 65K; in the loaded state, the test temperature may be 273+ 85K. Through the above calculation, the actual test duration in the no-load state needs 73 days, while the actual test duration in the loaded state only needs 20.21 days, and thus, the test duration is greatly shortened.

According to the technical scheme provided by the embodiment of the application, the loading test cabinet and the high-temperature test chamber can be adopted to carry out the durable aging test on the product to be tested, so that the aging speed of the product to be tested is increased, and the period of the durable aging test is shortened. Specifically, the product to be tested can be placed in the high-temperature test box, and the product to be tested can be electrically connected with the load port on the load test cabinet. The loading test cabinet can be connected with the control host, and the load value output by the load port can be adjusted through the control host, so that a product to be tested is placed in different load states for testing.

In the test process, the back of the loading test cabinet adopts a heat dissipation structure with air blowing and air suction channels, so that the ambient temperature of a product to be tested can be maintained within a proper range. The product that awaits measuring can be through debugging the serial ports with main control unit electric connection in the loading test cabinet, simultaneously, the main control unit can be through host computer interface and main control unit electric connection, like this, the main control unit just can real time communication with the product that awaits measuring, and the main control unit can adjust and control the state of the product that awaits measuring in real time alone. In addition, the control host can also set the load value of each group of load ports on the loading test cabinet according to the preconfigured load information, so that the global control of each product to be tested is realized.

Subsequently, the acceleration factors are respectively calculated for the no-load state and the loaded state of the product to be tested, so that the respective actual test duration of the no-load state and the loaded state can be determined. By comparing the actual test duration, the duration of the shortened endurance aging test can be determined.

Therefore, through the technical scheme provided by the application, the product to be tested can be subjected to single-path control or global control, and loading test and high-temperature test can be provided at the same time, so that the aging effect is improved. The specific shortened time length can be detected by calculating the actual test time length subsequently, so that the purpose of the endurance aging test is achieved, and the result of the endurance aging test can be evaluated.

It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications therefrom are within the scope of the invention.