1. A method for measuring the microstructure evolution of an energy-containing material is characterized by comprising the following steps:

acquiring a free surface speed historical curve of the energetic material; the free surface speed historical curve is obtained after the first laser beam irradiates the energetic material composite target;

acquiring diffraction data of the energetic material; the diffraction data is obtained after the X-ray source irradiates the energetic material composite target; the X-ray source is obtained by irradiating the composite backlight target by the second laser beam;

and determining the microstructure evolution characteristics of the energetic material according to the diffraction data and the free surface velocity historical curve.

2. The method for measuring the microstructure evolution of the energetic material as claimed in claim 1, wherein the determining the microstructure evolution characteristics of the energetic material according to the diffraction data and the free surface velocity history curve specifically comprises:

determining the dynamic load loading state of the energetic material according to the first time and the free surface speed historical curve; the first time is a time between the first laser beam and the second laser beam;

determining a dynamic load diffraction pattern of the energetic material according to the dynamic load loading state and the diffraction data;

and comparing the dynamic load diffraction pattern of the energetic material with the static X-ray diffraction pattern of the energetic material to obtain the microstructure change of the energetic material under the dynamic load.

3. A system for measuring the microstructural evolution of an energetic material, the system comprising:

the free surface speed historical curve acquisition module is used for acquiring a free surface speed historical curve of the energetic material; the free surface speed historical curve is obtained after the first laser beam irradiates the energetic material composite target;

the diffraction data acquisition module is used for acquiring diffraction data of the energetic material; the diffraction data is obtained after the X-ray source irradiates the energetic material composite target; the X-ray source is obtained by irradiating the composite backlight target by the second laser beam;

and the microstructure evolution characteristic determination module is used for determining the microstructure evolution characteristic of the energetic material according to the diffraction data and the free surface velocity historical curve.

4. The system for measuring the microstructure evolution of an energetic material as claimed in claim 3, wherein the module for determining the microstructure evolution characteristics comprises:

the macroscopic loading state determining submodule is used for determining the dynamic loading state of the energetic material according to the first time and the free surface speed historical curve; the first time is a time between the first laser beam and the second laser beam;

the diffraction pattern determining submodule is used for determining a dynamic load diffraction pattern of the energetic material according to the dynamic load loading state and the diffraction data;

and the microstructure change determination submodule is used for comparing the dynamic load diffraction pattern of the energetic material with the static X-ray diffraction pattern of the energetic material to obtain the microstructure change of the energetic material under dynamic load.

5. The device for measuring the microstructure evolution of the energetic material is characterized by comprising a first laser source, a second laser source, an energetic material composite target, a composite backlight target, a diffraction data acquisition component and a data processor; the data processor is internally provided with a measuring system for the micro-structural evolution of the energetic material as claimed in claim 3;

the first laser source is used for emitting a first laser beam to the energetic material composite target; the second laser source is used for emitting a second laser beam to the composite backlight target to generate an X-ray source; the X-ray source is used for irradiating the energetic material composite target to perform X-ray diffraction;

the diffraction data acquisition component is connected with the data processor and is used for acquiring diffraction data of X-ray diffraction imaging and sending the diffraction data to the data processor.

6. The apparatus for measuring microstructure evolution of an energetic material as claimed in claim 5, wherein the composite backlight target comprises a collimating assembly and a metal film connected to the collimating assembly, the composite backlight target for beam-target coupling with the second laser source to determine a laser injection position of the second laser beam.

7. The apparatus for measuring the micro-structural evolution of an energetic material as claimed in claim 6, wherein four target marks are provided on the metal film; the target identification is used for determining a laser injection position of the second laser beam; the diameter of the target mark is 100-200 microns, and the distance between the target marks is 500-800 microns.

8. The apparatus for measuring the micro-structural evolution of the energetic material as claimed in claim 5, wherein the energetic material composite target comprises a PI ablation layer, a plasma flight chamber, a metal flying piece, a flying piece flight chamber and the energetic material which are connected in sequence;

the thickness of the PI ablation layer is 10 micrometers, the thickness of the plasma flight cavity is 200 micrometers, the thickness of the metal flying piece is 20 micrometers, the thickness of the flying piece flight cavity is 100 micrometers, and the thickness of the energetic material is 300 micrometers.

9. The apparatus for measuring the microstructural evolution of energetic materials as in claim 5, wherein the first laser beam is a nanosecond laser beam; the second laser beam is a microfocus laser beam.

10. The method for measuring the evolution of the microstructure of an energy-containing material as claimed in claim 5, wherein the device for measuring the evolution of the microstructure of an energy-containing material further comprises a velocity interferometer;

the speed interferometer is connected with the data processor and is used for acquiring a free surface speed historical curve of the energetic material and sending the free surface speed historical curve to the data processor.

Background

Energetic materials are important components of high performance weapons; the research on the microstructure of the energetic material (including the research on the phase change of the energetic material, the state equation of the energetic material and the like) has important significance for the practical application of the energetic material. At present, due to the limitation of research means, the research on the phase change of energetic materials and the equation of state of energetic materials is still incomplete.

Under the condition of dynamic load, the dynamic response characteristics of the energetic material are mostly analyzed by adopting interface speed measurement, but the method belongs to an indirect measurement method, and the obtained experimental data cannot be completely and directly corresponding to the actual physical process. Although the microstructure evolution process of the sample can be obtained by methods such as X-ray diffraction and Raman spectroscopy, the methods are mostly limited by static or quasi-static loading conditions due to the limitations of light source intensity and time resolution.

In recent years, with the construction of Omega, NIF and other laser devices and free electron lasers (such as Linac Coherent Light Source, LCLS), laser energy output capability has been improved, making it possible to produce transient high-flux highly collimated X-ray sources.

Therefore, a method using an X-ray diffraction technique with time resolution (i.e. a dynamic X-ray diffraction technique) for microstructure measurement of an energetic material is needed to realize direct observation of the microstructure evolution process of the energetic material.

Disclosure of Invention

The invention aims to provide a method, a system and a device for measuring the microstructure evolution of an energy-containing material, which are used for directly measuring the microstructure evolution characteristic of the energy-containing material.

In order to achieve the purpose, the invention provides the following scheme:

a method for measuring the microstructure evolution of an energetic material comprises the following steps:

acquiring a free surface speed historical curve of the energetic material; the free surface speed historical curve is obtained after the first laser beam irradiates the energetic material composite target;

acquiring diffraction data of the energetic material; the diffraction data is obtained after the X-ray source irradiates the energetic material composite target; the X-ray source is obtained by irradiating the composite backlight target by the second laser beam;

and determining the microstructure evolution characteristics of the energetic material according to the diffraction data and the free surface velocity historical curve.

Optionally, the determining the microstructure evolution characteristic of the energetic material according to the diffraction data and the free surface velocity history curve specifically includes:

determining the dynamic load loading state of the energetic material according to the first time and the free surface speed historical curve; the first time is a time between the first laser beam and the second laser beam;

determining a dynamic load diffraction pattern of the energetic material according to the dynamic load loading state and the diffraction data;

and comparing the dynamic load diffraction pattern of the energetic material with the static X-ray diffraction pattern of the energetic material to obtain the microstructure change of the energetic material under the dynamic load.

In order to achieve the above purpose, the invention also provides the following scheme:

a system for measuring the microstructural evolution of energetic materials, comprising:

the free surface speed historical curve acquisition module is used for acquiring a free surface speed historical curve of the energetic material; the free surface speed historical curve is obtained after the first laser beam irradiates the energetic material composite target;

the diffraction data acquisition module is used for acquiring diffraction data of the energetic material; the diffraction data is obtained after the X-ray source irradiates the energetic material composite target; the X-ray source is obtained by irradiating the composite backlight target by the second laser beam;

and the microstructure evolution characteristic determination module is used for determining the microstructure evolution characteristic of the energetic material according to the diffraction data and the free surface velocity historical curve.

Optionally, the module for determining evolution characteristics of a microstructure specifically includes:

the macroscopic loading state determining submodule is used for determining the dynamic loading state of the energetic material according to the first time and the free surface speed historical curve; the first time is a time between the first laser beam and the second laser beam;

the diffraction pattern determining submodule is used for determining a dynamic load diffraction pattern of the energetic material according to the dynamic load loading state and the diffraction data;

and the microstructure change determination submodule is used for comparing the dynamic load diffraction pattern of the energetic material with the static X-ray diffraction pattern of the energetic material to obtain the microstructure change of the energetic material under dynamic load.

In order to achieve the above purpose, the invention also provides the following scheme:

a measuring device for microstructure evolution of energetic materials comprises a first laser source, a second laser source, an energetic material composite target, a composite backlight target, a diffraction data acquisition component and a data processor; the data processor is internally provided with a measuring system for the microstructure evolution of the energetic material;

the first laser source is used for emitting a first laser beam to the energetic material composite target; the second laser source is used for emitting a second laser beam to the composite backlight target to generate an X-ray source; the X-ray source is used for irradiating the energetic material composite target to perform X-ray diffraction;

the diffraction data acquisition component is connected with the data processor and is used for acquiring diffraction data of X-ray diffraction imaging and sending the diffraction data to the data processor.

Optionally, the composite backlight target includes a collimation assembly and a metal film connected to the collimation assembly, and the composite backlight target is configured to perform beam-target coupling with the second laser source to determine a laser injection position of the second laser beam.

Optionally, four target marks are arranged on the metal film; the target identification is used for determining a laser injection position of the second laser beam; the diameter of the target mark is 100-200 microns, and the distance between the target marks is 500-800 microns.

Optionally, the energetic material composite target comprises a PI ablation layer, a plasma flight cavity, a metal flying piece, a flying piece flight cavity and an energetic material which are connected in sequence;

the thickness of the PI ablation layer is 10 micrometers, the thickness of the plasma flight cavity is 200 micrometers, the thickness of the metal flying piece is 20 micrometers, the thickness of the flying piece flight cavity is 100 micrometers, and the thickness of the energetic material is 300 micrometers.

Optionally, the first laser beam is a nanosecond laser beam; the second laser beam is a microfocus laser beam.

Optionally, the device for measuring the microstructure evolution of the energetic material further comprises a velocity interferometer;

the speed interferometer is connected with the data processor and is used for acquiring a free surface speed historical curve of the energetic material and sending the free surface speed historical curve to the data processor.

According to the specific embodiment provided by the invention, the invention discloses the following technical effects:

irradiating the energetic material composite target by using a first laser beam to obtain a free surface speed historical curve of the energetic material; irradiating the composite backlight target by a second laser beam to obtain an X-ray source, and irradiating the energetic material composite target by the X-ray source to obtain diffraction data of the energetic material, specifically lattice diffraction data of the energetic material; and finally, determining the microstructure evolution characteristic of the energetic material according to the diffraction data and the free surface velocity historical curve, thereby realizing the direct measurement of the microstructure evolution characteristic of the energetic material, and having important significance for the dynamic response research of the energetic material.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.

Fig. 1 is a schematic flow chart of a method for measuring microstructure evolution of an energetic material according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of second beam target coupling of the method for measuring microstructure evolution of an energetic material according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of a system for measuring microstructure evolution of an energetic material according to a second embodiment of the present invention;

fig. 4 is a schematic structural diagram of a device for measuring microstructure evolution of an energetic material according to a third embodiment of the present invention;

fig. 5 is a schematic partial structural diagram of an energetic material composite target of a measuring apparatus for measuring the microstructure evolution of an energetic material provided by the third embodiment of the present invention;

fig. 6 is a static diffraction pattern of a typical energetic material HMX recorded on an IP board of the apparatus for measuring the microstructure evolution of an energetic material provided in the third embodiment of the present invention.

Description of the symbols:

1-target identification, 2-laser injection position, 3-metal film, 4-collimation accessory, 50-first laser beam, 51-second laser beam, 52-X-ray diffraction cone, 6-composite backlight target, 7-composite backlight target stand, 8-VISAR diagnostic light, 9-IP imaging plate, 10-PI ablation layer, 11-plasma flight cavity, 12-metal flight, 13-flight cavity and 14-energetic material.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

The invention aims to provide a method, a system and a device for measuring the microstructure evolution of an energy-containing material.

In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.

Example one

As shown in fig. 1, the present embodiment provides a method for measuring microstructure evolution of an energetic material, including:

step 101, acquiring a free surface speed historical curve of an energetic material; the free surface speed history curve is obtained after the first laser beam irradiates the energetic material composite target. Specifically, the first laser beam is a nanosecond laser beam, and the energetic material is included in the energetic material composite target; the nanosecond laser beam drives the energetic material composite target to enable the energetic material to generate a high-temperature and high-pressure state inside. And acquiring a free surface speed historical curve of the energetic material while carrying out laser loading on the energetic material.

Step 102, acquiring diffraction data of an energetic material; the diffraction data is obtained after an X-ray source irradiates the energetic material composite target, and the diffraction data is X-ray lattice diffraction data of the energetic material; the X-ray source is obtained after the second laser beam irradiates the composite backlight target. Specifically, the second laser beam is a micro-focus laser beam, and the micro-focus laser beam interacts with the composite backlight target to generate a transient high-flux collimated X-ray source.

In the embodiment, the diffraction signal is recorded by the IP imaging plate, and the recorded diffraction signal on the IP imaging plate is subjected to data reproduction by an IP reading instrument.

And 103, determining the microstructure evolution characteristics of the energetic material according to the diffraction data and the free surface velocity historical curve.

Step 103, specifically comprising:

and step 1031, determining the dynamic load loading state of the energetic material according to the first time and the free surface speed historical curve. The first time is the time interval between the first laser beam and the second laser beam, i.e. after step 101 is completed, the first time is delayed, and then step 102 is performed. Preferably, the first time is related to the physical process under study and the first time is in the order of hundreds of ps to ns.

And 1032, determining a dynamic load diffraction pattern of the energetic material according to the dynamic load loading state and the diffraction data.

And 1033, comparing the diffraction pattern of the dynamic load of the energy-containing material with the static X-ray diffraction pattern of the energy-containing material to obtain the microstructure change of the energy-containing material under the dynamic load. Further, the obtained change conditions of the lattice compressibility of the energetic material, the microstructure of the lattice of the energetic material and the like and related results can be used for research on the state equation, phase change and the like of the energetic material under dynamic load.

Preferably, step 100 is further performed before step 101, wherein step 100 comprises coupling a first laser beam with a first beam target of the energetic material composite target and coupling a second laser beam with a second beam target of the composite backlight target; the action time of the first beam target coupling and the second beam target coupling is short (hundreds of ps-ns magnitude).

In the coupling process of the beam target, the diffraction system uses a diffraction system with two-dimensional dimensions of dozens of millimeters multiplied by hundred millimeters, and the target accommodating space of the laser aiming target system is usually several millimeters multiplied by dozens of millimeters. Taking the second beam target coupling as an example, as shown in fig. 2, four target identifiers 1 on the composite backlight target are determined by using a plurality of long-focus microscope devices, wherein the target identifiers 1 are circular, the diameter of each target identifier 1 is 100-200 μm, and the distance between the target identifiers 1 is 500-800 μm; and connecting the relative circle centers of the four target marks 1, wherein the intersecting position of the connecting lines is the laser injection position 2, so that the aiming deviation of the laser injection point is less than 100 mu m.

Example two

As shown in fig. 3, the present embodiment provides a system for measuring microstructure evolution of an energetic material, which includes a free surface velocity history curve obtaining module 201, a diffraction data obtaining module 202, and a microstructure evolution characteristic determining module 203.

The free surface speed historical curve obtaining module 201 is used for obtaining a free surface speed historical curve of the energetic material; the free surface speed history curve is obtained after the first laser beam irradiates the energetic material composite target.

The diffraction data acquisition module 202 is used for acquiring diffraction data of the energetic material; the diffraction data is obtained after the X-ray source irradiates the energetic material composite target; the X-ray source is obtained after the second laser beam irradiates the composite backlight target.

The microstructure evolution characteristic determining module 203 is used for determining the microstructure evolution characteristic of the energetic material according to the diffraction data and the free surface velocity history curve.

Specifically, the microstructure evolution characteristic determining module 203 specifically includes a macroscopic loading state determining submodule, a diffraction pattern determining submodule, and a microstructure change determining submodule.

The macroscopic loading state determining submodule is used for determining the dynamic loading state of the energetic material according to the first time and the free surface speed historical curve; the first time is a time between the first laser beam and the second laser beam.

And the diffraction pattern determination submodule is used for determining the dynamic load diffraction pattern of the energetic material according to the dynamic load loading state and the diffraction data.

And the microstructure change determination submodule is used for comparing the dynamic load diffraction pattern of the energy-containing material with the static X-ray diffraction pattern of the energy-containing material to obtain the microstructure change of the energy-containing material under dynamic load.

EXAMPLE III

As shown in fig. 4, the present embodiment provides a device for measuring microstructure evolution of an energetic material, which includes a first laser source, a second laser source, an energetic material composite target, a composite backlight target 6, a diffraction data acquisition component, and a data processor; the data processor is internally provided with the system for measuring the microstructure evolution of the energetic material provided by the second embodiment. The first laser source is used for emitting a first laser beam 50 to the energetic material composite target; the second laser source is used for emitting a second laser beam 51 to the composite backlight target 6 to generate an X-ray source, wherein the composite backlight target 6 is arranged on the composite backlight target holder 7; the X-ray source is used for irradiating the energetic material composite target to perform X-ray diffraction, namely an X-ray diffraction cone 52 in the figure 4 is generated; the diffraction data acquisition component is connected with the data processor and is used for acquiring diffraction data of X-ray diffraction imaging and sending the diffraction data to the data processor. Specifically, the diffraction data acquisition means includes an IP imaging plate 9.

Further, as shown in fig. 2, the composite backlight target 6 includes a collimating assembly 4 and a metal film 3 connected to the collimating assembly, and the composite backlight target 6 is configured to perform beam-target coupling with the second laser source to determine a laser injection position of the second laser beam. Because the quasi-He X-ray generated by the interaction of the second laser beam and the second metal film has the characteristic of high transient flux, aiming at the characteristics that the energetic material has low crystal symmetry, so that the diffraction peaks of the diffraction pattern are more and the counting intensity of each diffraction peak is greatly different, in the embodiment, the quasi-He X-ray generated by the interaction of the second laser beam and the second metal film is collimated through the combined action of the second metal film and the second collimation accessory. In the experimental process, the collimation adjustment of the X-ray source is realized by adjusting the size of the collimation fitting.

Preferably, four target marks 1 are disposed on the metal film 3; the target mark 1 is used for determining a laser injection position 2 of the first laser beam; the diameter of the target mark 1 is 100-200 microns, and the distance between the target marks 1 is 500-800 microns.

Further, as shown in fig. 5, the energetic material composite target includes a PI ablation layer 10, a plasma flight chamber 11, a metal flight 12, a flight chamber 13, and an energetic material 14, which are connected in sequence. When the first laser beam irradiates the PI ablation layer 10, strong laser ablates the PI ablation layer 10 to generate high-speed flying plasma; the plasma acts on the metal flying piece through the plasma flying cavity 11 to drive the metal flying piece 12 to move at a high speed; the metal flying sheet 12 moving at a high speed fully absorbs plasma energy through the flying sheet flying cavity 13 and then impacts the energetic material 14, and a high-temperature and high-pressure state with a one-dimensional plane area is generated in the energetic material 14.

In this embodiment, the first laser beam is a beam-smoothed nanosecond laser beam, the nanosecond laser beam drives the metal flying piece to impact the energetic material, and the high-temperature and high-pressure state generated in the energetic material is related to the loading laser parameters (laser energy/pulse width/light spot) and the target structure parameters (ablation layer/plasma flying cavity/metal flying piece/flying piece flying cavity/energetic material) of the nanosecond laser beam. By combining different loading laser parameters and target structure parameters, a wide range of high temperature and high pressure conditions can be produced in the energetic material. Specifically, the loading laser parameters are: the nanosecond laser beam is loaded with energy of 300J, the pulse width is 3ns, and the loaded laser spot is 3mmCPP and is uniform and smooth. The target structure parameters are: the thickness of the PI ablation layer 10 is 10 micrometers, the thickness of the plasma flight cavity 11 is 200 micrometers, the thickness of the metal flying piece 12 is 20 micrometers, the thickness of the flying piece flight cavity 13 is 100 micrometers, and the thickness of the energetic material 14 is 300 micrometers; and the loading pressure of the device under the setting condition is several GPa. If the loading energy of the first laser beam is adjusted to be several thousand J, the loading pressure may be several tens GPa.

In this embodiment, the apparatus for measuring the microstructure evolution of the energetic material further comprises a velocity interferometer; the speed interferometer is connected with the data processor and is used for acquiring a free surface speed historical curve of the energetic material and sending the free surface speed historical curve to the data processor. The Velocity Interferometer (VISAR) can measure any reflecting surface, specifically, VISAR diagnostic light 8 is emitted to obtain a free surface velocity history curve of the energetic material, and then the shock wave take-off time in the energetic material and the dynamic load loading state of the energetic material are obtained.

Preferably, the diffraction data acquisition component comprises an IP imaging board 9 and an IP reading device, wherein the IP imaging board 9 records imaging data of X-ray diffraction in diffraction measurement, and then the IP reading device is used to perform data reproduction on diffraction signals recorded on the IP imaging board 9 to obtain an X-ray diffraction spectrum. In this embodiment, the IP imaging panel 9 does not have a time resolution function, and the time resolution is realized by a time-resolved X-ray source. As shown in fig. 6, the static diffraction pattern of typical energetic material HMX recorded via an IP plate reproduced by an IP reader.

Aiming at the research requirement of the energetic material, the dynamic X-ray diffraction technology is used for the research of the dynamic response characteristic of the energetic material, and the direct measurement of the microstructure evolution characteristic of the energetic material is realized. Meanwhile, the characteristics of the energetic material are combined, the targeted analysis is carried out on the aspects of an experimental structure, an X-ray source, a target aiming and the like, and the method has important significance for the research on the dynamic response of the energetic material.

Compared with the prior art, the invention also has the following advantages:

(1) at present, a sensor is mostly adopted for aiming a target by a nanosecond laser device, and the nanosecond laser device is characterized in that the target aiming precision is high (better than 30 mu m), and the target posture can be monitored in three dimensions. But the sensor can only aim at a small-size target due to the limitation of target accommodating space and focal distance. Aiming at the target aiming requirement of a large-size target on a nanosecond laser device, the invention aims the target by matching a plurality of long-focus microscope devices with a target mark, realizes beam target coupling and solves the problem of aiming the large-size target on the nanosecond laser device.

(2) In the current dynamic X-ray diffraction technology, collimation accessories of an X-ray source are all placed behind a sample to be measured, the size of the collimation accessories is limited in order to measure more diffraction patterns in an experiment, and the divergence of the X-ray source is larger than 0.3 degrees generally. The invention arranges the collimation accessory at the front end of the sample to be measured, and the collimation accessory and the metal film together form the composite backlight target, thereby solving the problem that the dynamic loading, the high collimation X-ray source and the wide angle X-ray diffraction receiving range are mutually restricted.

The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.

The principles and embodiments of the present invention have been described herein using specific examples, which are provided only to help understand the method and the core concept of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.