1. An automatic test method applied to a capacitance double-parameter test sorting machine is characterized by comprising the following steps:

s1, connecting the capacitance test instrument with a switch network;

s2, building the switch network by using a radio frequency mechanical relay switch;

s3, dividing signals of a current-driven high-end Hcur port, a voltage-detection high-end Hpot port, a current-driven low-end Lcur port and a voltage-detection high-end Lpot port of the capacitance test instrument into multiple paths by the built switch network, and conducting one channel each time;

s4, fixing the multi-path test probes on the upper and lower needle cards respectively;

and S5, connecting the capacitance test instrument, the switch network and the test probe, and performing automatic test by using the test probe.

2. The automatic testing method applied to the capacitive two-parameter testing handler of claim 1, wherein the step S1 comprises:

a capacitance test meter matched switching network includes, but is not limited to, four sets;

the capacitance test meter includes, but is not limited to, an LCR meter, a capacitance meter, or a digital bridge.

3. The automatic test method applied to the capacitive two-parameter test handler of claim 1, wherein the relay in the step S2 includes but is not limited to:

single pole single throw relay, single pole double throw relay, single pole 3 throw relay, single pole 4 throw relay, single pole 5 throw relay, single pole 6 throw relay, single pole 7 throw relay, single pole 8 throw relay, single pole 9 throw relay, single pole 10 throw relay, single pole 11 throw relay, single pole 12 throw relay, single pole 13 throw relay, single pole 14 throw relay, single pole 15 throw relay, single pole 16 throw relay, single pole 17 throw relay, single pole 18 throw relay, single pole 19 throw relay, and single pole 20 throw relay.

4. The automatic testing method applied to the capacitive two-parameter testing handler of claim 1, wherein the step S5 comprises:

connecting a current-driven high-end Hcur port and a voltage-detection high-end Hpot port of each channel to a probe in a pincard;

the current-driven low-side Lcur port and the voltage-detection high-side Lpot port of each channel are connected with one probe in another pin card.

Background

With the rapid development of Chinese economy, the existing capacitance test equipment in the market at present is divided into two types, the first type is a multi-channel common electrode test mode, and the second type is a single-meter or multi-meter matched up-down probe movement test mode. The Hcur and the Hpot of the capacitance test instrument in the first type of test mode divide the signal into a plurality of ways through a switch network and then are respectively connected with one end electrode of a plurality of capacitors to be tested through the test needle card, and Lpot and Lcur are tested through the other end electrode connection of the capacitors to be tested through the metal plate, and the first type of equipment has the following defects: high frequency capacitance (1MHz) cannot be tested. The second type of test mode is a single-meter or multi-meter matched up-down probe movement test mode, the system is provided with 1 or more capacitance test meters, Hcur and Hpot of the capacitance test meters are respectively connected with one probe, Lpot and Lcur are connected with one probe, and the two probes are respectively connected with two electrodes of a capacitor for testing. The multi-channel test is realized by controlling the movement of the probe or the device carrier through the plane motion mechanism, and the second type of equipment has the following defects: the cost is high, a plurality of capacitance test instruments are needed, a transverse plane motion mechanism is added, the test efficiency is low, the channels are switched in a mechanical moving mode, and the test efficiency of the two channels can only reach 100 pcs/min). In order to overcome the above disadvantages, an automatic testing method applied to a capacitance double-parameter testing sorter is needed, which can realize multi-channel high-speed testing and automatic sorting of capacitance values and loss parameters of a high-frequency (1MHz) capacitor by only one capacitance testing instrument, and simultaneously ensure high efficiency of testing.

Disclosure of Invention

In order to solve the problems in the prior art, the invention provides an automatic testing method applied to a capacitance double-parameter testing sorting machine, which can realize multi-channel high-speed testing and automatic sorting of the capacitance value and the loss parameter of a high-frequency (1MHz) capacitor by only one capacitance testing instrument and simultaneously ensure the high efficiency of the testing.

In order to achieve the purpose, the invention adopts the technical scheme that: an automatic test method applied to a capacitance double-parameter test sorting machine comprises the following steps:

s1, connecting the capacitance test instrument with a switch network;

s2, building the switch network by using a radio frequency mechanical relay switch;

s3, dividing signals of a current-driven high-end Hcur port, a voltage-detection high-end Hpot port, a current-driven low-end Lcur port and a voltage-detection high-end Lpot port of the capacitance test instrument into multiple paths by the built switch network, and conducting one channel each time;

s4, fixing the multi-path test probes on the upper and lower needle cards respectively;

and S5, connecting the capacitance test instrument, the switch network and the test probe, and performing automatic test by using the test probe.

In the technical scheme, the capacitance test instrument is provided with a current drive high-end Hcur, a current drive low-end Lcur, a voltage detection high-end Hpot, a voltage detection low-end Lpot and four pairs of test ends corresponding to the shielding ends of each test end, one capacitance test instrument is connected with four sets of switch networks, the defect that a plurality of capacitance test instruments can be used for testing in the prior art is overcome, meanwhile, a radio frequency mechanical relay switch is used for constructing the switch networks, the constructed switch networks are conducted one channel at a time, a transverse plane motion mechanism is not required to be added, the constructed switch networks divide signals of the current drive high-end Hcur port, the voltage detection high-end Hpot port, the current drive low-end Lcur port and the voltage detection high-end Lpot port of the capacitance test instrument into multiple channels respectively and conduct one channel at a time, and multi-channel high-speed testing and automatic sorting of capacitance values and loss parameters of a high-frequency (1MHz) capacitor are realized, the multi-path test probes are fixed on the upper pin card and the lower pin card respectively, are connected with the capacitance test instrument, the switch network and the test probes, and are used for automatic test, so that the test efficiency is ensured.

In a further aspect, step S1 includes:

a capacitance test meter matched switching network includes, but is not limited to, four sets;

the capacitance test meter includes, but is not limited to, an LCR meter, a capacitance meter, or a digital bridge.

In the technical scheme, four sets of switch networks (or one set, or two sets, or three sets) are adopted.

In a further aspect, the relay in step S2 includes but is not limited to:

single pole single throw relay, single pole double throw relay, single pole 3 throw relay, single pole 4 throw relay, single pole 5 throw relay, single pole 6 throw relay, single pole 7 throw relay, single pole 8 throw relay, single pole 9 throw relay, single pole 10 throw relay, single pole 11 throw relay, single pole 12 throw relay, single pole 13 throw relay, single pole 14 throw relay, single pole 15 throw relay, single pole 16 throw relay, single pole 17 throw relay, single pole 18 throw relay, single pole 19 throw relay, and single pole 20 throw relay.

In the present embodiment, different links are formed according to various relay switches.

In a further aspect, step S5 includes:

connecting a current-driven high-end Hcur port and a voltage-detection high-end Hpot port of each channel to a probe in a pincard;

the current-driven low-side Lcur port and the voltage-detection high-side Lpot port of each channel are connected with one probe in another pin card.

In the technical scheme, the test probe is used for automatic test, so that the high test efficiency is ensured.

The invention has the beneficial effects that:

(1) the automatic test method applied to the capacitance double-parameter test sorting machine can test the high-frequency capacitance (1 MHz);

(2) the automatic testing method applied to the capacitance double-parameter testing sorting machine is low in cost, does not need a plurality of capacitance testing instruments, does not need to increase a transverse plane motion mechanism, and is high in testing efficiency;

(3) the automatic test method applied to the capacitance double-parameter test sorting machine realizes multi-channel high-speed test and automatic sorting of the capacitance value and the loss parameter of the high-frequency (1MHz) capacitor by only one capacitance test instrument, and simultaneously ensures the high efficiency of the test.

Drawings

Fig. 1 is a flow chart of an automatic testing method applied to a capacitive two-parameter testing sorter according to the present invention.

Detailed Description

Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

Example (b):

as shown in fig. 1, the present invention provides an automatic testing method applied to a capacitive two-parameter testing handler, comprising the following steps:

s1, connecting the capacitance test instrument with a switch network;

s2, building the switch network by using a radio frequency mechanical relay switch;

s3, dividing signals of a current-driven high-end Hcur port, a voltage-detection high-end Hpot port, a current-driven low-end Lcur port and a voltage-detection high-end Lpot port of the capacitance test instrument into multiple paths by the built switch network, and conducting one channel each time;

s4, fixing the multi-path test probes on the upper and lower needle cards respectively;

and S5, connecting the capacitance test instrument, the switch network and the test probe, and performing automatic test by using the test probe.

In the embodiment, the capacitance test instrument is provided with a current-driven high-end Hcur, a current-driven low-end Lcur, a voltage-detected high-end Hpot, a voltage-detected low-end Lpot and four pairs of testing ends corresponding to the shielding ends of each testing end, one capacitance test instrument is connected with four sets of switch networks, the defect that a plurality of capacitance test instruments are needed to test in the prior embodiment is overcome, meanwhile, the switch networks are built by using radio frequency mechanical relay switches, the built switch networks are conducted one channel at a time without adding a transverse plane motion mechanism, the built switch networks divide signals of the current-driven high-end Hcur port, the voltage-detected high-end Hpot port, the current-driven low-end Lcur port and the voltage-detected high-end Lpot port of the capacitance test instrument into multiple channels respectively and conduct one channel at a time, and multi-channel high-speed testing and automatic sorting of capacitance values and loss parameters of a high-frequency (1MHz) capacitor are realized, the multi-path test probes are fixed on the upper pin card and the lower pin card respectively, are connected with the capacitance test instrument, the switch network and the test probes, and are used for automatic test, so that the test efficiency is ensured.

In another embodiment, step S1 includes:

a capacitance test meter matched switching network includes, but is not limited to, four sets;

the capacitance test meter includes, but is not limited to, an LCR meter, a capacitance meter, or a digital bridge.

In this embodiment, four sets of switch networks (one set, two sets, or three sets).

In another embodiment, the relay in step S2 includes but is not limited to:

single pole single throw relay, single pole double throw relay, single pole 3 throw relay, single pole 4 throw relay, single pole 5 throw relay, single pole 6 throw relay, single pole 7 throw relay, single pole 8 throw relay, single pole 9 throw relay, single pole 10 throw relay, single pole 11 throw relay, single pole 12 throw relay, single pole 13 throw relay, single pole 14 throw relay, single pole 15 throw relay, single pole 16 throw relay, single pole 17 throw relay, single pole 18 throw relay, single pole 19 throw relay, and single pole 20 throw relay.

In this embodiment, different links formed according to various relay switches are also included.

In another embodiment, step S5 includes:

connecting a current-driven high-end Hcur port and a voltage-detection high-end Hpot port of each channel to a probe in a pincard;

the current-driven low-side Lcur port and the voltage-detection high-side Lpot port of each channel are connected with one probe in another pin card.

In the embodiment, the test probe is used for automatic test, so that the high efficiency of the test is ensured.

The above-mentioned embodiments only express the specific embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention.