1. A method for semiconductor test program threshold updating, comprising:

the testing machine tests the chip, analyzes the test data, and uploads the analyzed test data to the server;

the server receives the analyzed test data and stores the received test data into a database of the server;

extracting a sample value from the database according to the sampling parameter, and obtaining a first dynamic threshold value and a second dynamic threshold value according to the sample value;

acquiring the first dynamic threshold and the second dynamic threshold;

and comparing the measured value of the chip test with the first dynamic threshold and the second dynamic threshold, and judging whether the chip is a good product or a defective product.

2. The method of claim 1, wherein the extracting sample values from the database according to the sampling parameters and deriving first and second dynamic thresholds according to the sample values comprises:

and extracting a sample value from the database according to a sampling parameter, wherein the sampling parameter comprises a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, a test item information parameter and a convergence interval n, and a first dynamic threshold value and a second dynamic threshold value are obtained according to the sample value.

3. The method of claim 1 or 2, wherein the extracting the sample values from the database according to the sampling parameters and obtaining the first dynamic threshold and the second dynamic threshold according to the sample values comprises:

extracting sample values from the database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling mode s is the designated batch number, organizing SQL search statements according to the batch information slot and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

4. The method of any of claims 1-3, wherein the extracting the sample values from the database according to the sampling parameters, and deriving the first dynamic threshold and the second dynamic threshold according to the sample values comprises:

extracting sample values from the database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling modes s are the specified number, organizing SQL search statements according to the latest m database records and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

5. The method of any of claims 1-3, wherein the extracting the sample values from the database according to the sampling parameters, and deriving the first dynamic threshold and the second dynamic threshold according to the sample values comprises:

extracting sample values from the database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling mode s is the designated time, organizing the SQL search statement according to the start time sdate, the end time edate and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

6. A system for semiconductor test program threshold updating, comprising:

the testing machine is used for testing the chip, analyzing the test data and uploading the analyzed test data to the server;

the server is used for receiving the analyzed test data and storing the received test data into a database of the server;

the calculation unit is used for extracting sample values from the database according to the sampling parameters and calculating a first dynamic threshold value and a second dynamic threshold value according to the sample values;

an obtaining unit, configured to obtain the first dynamic threshold and the second dynamic threshold;

and the judging unit is used for comparing the measured value of the chip test with the first dynamic threshold and the second dynamic threshold and judging whether the chip is good or not.

7. The system for semiconductor test program threshold updating of claim 6, wherein the computing unit is configured to:

and extracting a sample value from the database according to a sampling parameter, wherein the sampling parameter comprises a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, a test item information parameter and a convergence interval n, and a first dynamic threshold value and a second dynamic threshold value are obtained according to the sample value.

8. The system for semiconductor test program threshold updating according to claim 6 or 7, wherein the computing unit is configured to:

extracting sample values from the database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling mode s is the designated batch number, organizing SQL search statements according to the batch information slot and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

9. The system for semiconductor test program threshold updating according to any of claims 6-8, wherein the computing unit is configured to:

extracting sample values from the database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling modes s are the specified number, organizing SQL search statements according to the latest m database records and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

10. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 5.

Background

In semiconductor chip testing, a test program is composed of many test items, such as a current test, a voltage test, a frequency test, and the like. Different test items have different specifications, namely a first threshold value Hilimit and a second threshold value Lolimit set in a program, and the basic test principle is as follows: assuming that the actual value of each test item is Meas, if Meas is greater than Lolimit and Meas is less than Hilimit, the test item Pass is judged, and if all the test items Pass, the chip is finally judged to be Pass (good product); if any test item Fail skips over the rest test items, the chip is directly judged as Fail.

After the test program is adjusted and fixed, release is carried out to the factory for daily test mass production, but there are two following requirements:

a. due to Wafer/IC process issues, the lot-to-lot metrology Meas may drift and even exceed the first threshold value HiLimit and the second threshold value LoLimit, resulting in lot-to-lot yield issues, for which only one version of the test procedure (the first threshold value HiLimit and the second threshold value LoLimit are temporarily modified) can be updated before retesting.

b. The chips such as the car gauge/military industry and the like need high reliability, and when the current general program architecture test is completed, the chips with the measurement value Pass but the distribution is not ideal are judged to be Fail so as to ensure the ultralow defective rate of delivered chips. For such a situation, offline analysis can only be performed on the tested data at present, and the secondary point removal is realized by an unsatisfactory chip, so that the problems of large workload and hysteresis exist.

Disclosure of Invention

The embodiment of the application provides a method and a system for updating a threshold value of a semiconductor test program, provides a solution for testing a large number of chips with high requirements and high reliability such as a vehicle gauge chip, a military worker chip and the like, improves the testing efficiency and the testing convenience, and greatly reduces the defective rate.

In a first aspect, an embodiment of the present application provides a method for updating a threshold of a semiconductor test program, including:

the testing machine tests the chip, analyzes the test data, and uploads the analyzed test data to the server;

the server receives the analyzed test data and stores the received test data into a database of the server;

extracting a sample value from the database according to the sampling parameter, and obtaining a first dynamic threshold value and a second dynamic threshold value according to the sample value;

acquiring the first dynamic threshold and the second dynamic threshold;

and comparing the measured value of the chip test with the first dynamic threshold and the second dynamic threshold, and judging whether the chip is a good product or a defective product.

Wherein, the extracting the sample value from the database according to the sampling parameter and obtaining the first dynamic threshold value and the second dynamic threshold value according to the sample value include:

and extracting a sample value from the database according to a sampling parameter, wherein the sampling parameter comprises a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, a test item information parameter and a convergence interval n, and a first dynamic threshold value and a second dynamic threshold value are obtained according to the sample value.

Wherein, the extracting the sample value from the database according to the sampling parameter and obtaining the first dynamic threshold value and the second dynamic threshold value according to the sample value include:

extracting sample values from the database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling mode s is the designated batch number, organizing SQL search statements according to the batch information slot and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

Wherein, the extracting the sample value from the database according to the sampling parameter and obtaining the first dynamic threshold value and the second dynamic threshold value according to the sample value include:

extracting sample values from the database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling modes s are the specified number, organizing SQL search statements according to the latest m database records and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

Wherein, the extracting the sample value from the database according to the sampling parameter and obtaining the first dynamic threshold value and the second dynamic threshold value according to the sample value include:

extracting sample values from the database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling mode s is the designated time, organizing the SQL search statement according to the start time sdate, the end time edate and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

In a second aspect, the present application provides a system for semiconductor test program threshold updating, comprising:

the testing machine is used for testing the chip, analyzing the test data and uploading the analyzed test data to the server;

the server is used for receiving the analyzed test data and storing the received test data into a database of the server;

the calculation unit is used for extracting sample values from the database according to the sampling parameters and calculating a first dynamic threshold value and a second dynamic threshold value according to the sample values;

an obtaining unit, configured to obtain the first dynamic threshold and the second dynamic threshold;

and the judging unit is used for comparing the measured value of the chip test with the first dynamic threshold and the second dynamic threshold and judging whether the chip is good or not.

Wherein the computing unit is to:

and extracting a sample value from the database according to a sampling parameter, wherein the sampling parameter comprises a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, a test item information parameter and a convergence interval n, and a first dynamic threshold value and a second dynamic threshold value are obtained according to the sample value.

Wherein the computing unit is to:

extracting sample values from the database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling mode s is the designated batch number, organizing SQL search statements according to the batch information slot and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

Wherein the computing unit is to:

extracting sample values from the database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling modes s are the specified number, organizing SQL search statements according to the latest m database records and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

In a third aspect, the present application provides a computer-readable storage medium, on which a computer program is stored, and the computer program is used for implementing the steps of any one of the above methods when executed by a processor.

The method and the system for updating the threshold of the semiconductor test program have the following beneficial effects:

the method for updating the threshold value of the semiconductor test program comprises the following steps: the testing machine tests the chip, analyzes the test data, and uploads the analyzed test data to the server; the server receives the analyzed test data and stores the received test data into a database of the server; extracting a sample value from a database according to the sampling parameter, and obtaining a first dynamic threshold value and a second dynamic threshold value according to the sample value; acquiring a first dynamic threshold and a second dynamic threshold; and comparing the measured value of the chip test with the first dynamic threshold and the second dynamic threshold, and judging whether the chip is a good product or a defective product. The application provides a solution for the test of a large amount of high reliability chips of needs such as car rule/military project, has improved the convenience of efficiency of software testing and test, greatly reduced the defective rate.

Drawings

FIG. 1 is a flowchart illustrating a method for updating a threshold of a semiconductor test program according to an embodiment of the present disclosure;

FIG. 2 is a flowchart illustrating another method for updating threshold values of a semiconductor test program according to an embodiment of the present disclosure;

FIG. 3 is a block diagram illustrating a system for updating threshold values of a semiconductor test program according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of a server according to an embodiment of the present application.

Detailed Description

The present application is further described with reference to the following figures and examples.

In the following description, the terms "first" and "second" are used for descriptive purposes only and are not intended to indicate or imply relative importance. The following description provides embodiments of the invention, which may be combined or substituted for various embodiments, and this application is therefore intended to cover all possible combinations of the same and/or different embodiments described. Thus, if one embodiment includes feature A, B, C and another embodiment includes feature B, D, then this application should also be considered to include an embodiment that includes one or more of all other possible combinations of A, B, C, D, even though this embodiment may not be explicitly recited in text below.

The following description provides examples, and does not limit the scope, applicability, or examples set forth in the claims. Changes may be made in the function and arrangement of elements described without departing from the scope of the disclosure. Various examples may omit, substitute, or add various procedures or components as appropriate. For example, the described methods may be performed in an order different than the order described, and various steps may be added, omitted, or combined. Furthermore, features described with respect to some examples may be combined into other examples.

As shown in fig. 1-2, the method for updating the threshold of the semiconductor test program of the present application includes: s101, testing the chip by using a testing machine, analyzing test data, and uploading the analyzed test data to a server; s103, the server receives the analyzed test data and stores the received test data into a database of the server; s105, extracting a sample value from a database according to the sampling parameter, and obtaining a first dynamic threshold value and a second dynamic threshold value according to the sample value; s107, acquiring a first dynamic threshold and a second dynamic threshold; s109, comparing the measured value of the chip test with the first dynamic threshold and the second dynamic threshold, and judging whether the chip is good or not. As described in detail below.

S101, the testing machine tests the chip, analyzes the test data, and uploads the analyzed test data to the server.

The real-time Test Data analysis and uploading script pipeline RTMS Client is deployed on a PC (personal computer) of each testing machine, can analyze Test Data (datalog, STDF (Standard Test Data File, and the like)) in real time, and uploads each Parametric Test result, namely a measurement value Meas, to an RTMS DPAT Server database.

And S103, the server receives the analyzed test data and stores the received test data in a database of the server.

The RTMS DPAT Server is used for storing Parametric test data Meas uploaded by all machines and storing any data of a plurality of test items.

And S105, extracting a sample value from the database according to the sampling parameter, and obtaining a first dynamic threshold value and a second dynamic threshold value according to the sample value.

In some embodiments, the dynamic test item Limit calculation and Service pipe DPAT WebService is capable of: extracting effective sample values Meas from the database according to the transmitted parameters (including sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter, limit convergence interval n, etc.), calculating the average value Mean and variance value sigma, and then dynamically returning:

Dynamic_LoLimit＝Mean–σ*n，

Dynamic_HiLimit＝Mean+σ*n。

specifically, sample values are extracted from a database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate (start time)/edate (end time), test item information parameter and a convergence interval n;

when the sampling mode s is a designated batch number, searching sentences according to batch information ilot and test item information parameter organization SQL (Structured Query Language); extracting a sample according to the SQL search statement; calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values; calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

Specifically, sample values are extracted from a database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n; when the sampling modes s are the specified number, organizing SQL search statements according to the latest m database records and the test item information parameter; extracting a sample according to the SQL search statement; calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values; calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

The latest m database records are the latest m database records before the current time.

Specifically, sample values are extracted from a database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n; when the sampling mode s is the designated time, organizing the SQL search statement according to the start time sdate, the end time edate and the test item information parameter; extracting a sample according to the SQL search statement; calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values; calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

S107, a first dynamic threshold and a second dynamic threshold are obtained.

And the testing program DPAT acquires that the part calls Web Service according to the chip testing requirement, transmits corresponding parameters and transmits returned Dynamic _ Lolimit and Dynamic _ Hilimit to program variables.

S109, comparing the measured value of the chip test with the first dynamic threshold and the second dynamic threshold, and judging whether the chip is good or not.

DPAT operation: this step mainly compares one or more of the specified measurement values Meas with the Dynamic _ limit and the Dynamic _ limit, and if Fail is detected by comparing the values Meas < Dynamic _ limit or Meas > Dynamic _ limit, the chip DPAT tests Fail, generally using a special number such as 99 to identify the failure category.

The application provides a brand-new algorithm and a server for automatically updating the Limit (DPAT) of a semiconductor test program, provides a solution for testing a large number of chips with high requirements and high reliability such as vehicle specifications/military industry, greatly reduces the defective product PPM (Parts Per Million ), and improves the test efficiency and the test convenience.

As shown in fig. 3, the present application provides a system for updating threshold of semiconductor test program, which includes: the tester 201 is used for testing the chip, analyzing the test data, and uploading the analyzed test data to the server; the server 202 is used for receiving the analyzed test data and storing the received test data into a database of the server; a calculating unit 203, configured to extract a sample value from a database according to the sampling parameter, and calculate a first dynamic threshold and a second dynamic threshold according to the sample value; an obtaining unit 204, configured to obtain a first dynamic threshold and a second dynamic threshold; the determining unit 205 is configured to compare the measurement value of the chip test with the first dynamic threshold and the second dynamic threshold, and determine whether the chip is good or bad.

Wherein the calculation unit is configured to:

and extracting a sample value from the database according to a sampling parameter, wherein the sampling parameter comprises a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n, and a first dynamic threshold value and a second dynamic threshold value are obtained according to the sample value.

Wherein the calculation unit is configured to:

extracting a sample value from a database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling mode s is the designated batch number, organizing SQL search statements according to the batch information slot and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

Wherein the calculation unit is configured to:

extracting a sample value from a database according to sampling parameters, wherein the sampling parameters comprise a sampling mode s, batch information ilot, quantity information m, time period information sdate/edate, test item information parameter and a convergence interval n;

when the sampling modes s are the specified number, organizing SQL search statements according to the latest m database records and the test item information parameter; extracting a sample according to the SQL search statement;

calculating the Mean value Mean and the variance value sigma of the extracted sample parameter values;

calculating a first dynamic threshold and a second dynamic threshold:

a first Dynamic threshold dynamiclimit means + σ n;

a second Dynamic threshold value Dynamic _ limit ═ Mean- σ n; n is a convergence interval.

In the present application, the system embodiment of semiconductor test program threshold updating is substantially similar to the method embodiment of semiconductor test program threshold updating, and reference is made to the introduction of the method embodiment of semiconductor test program threshold updating.

It is clear to a person skilled in the art that the solution according to the embodiments of the invention can be implemented by means of software and/or hardware. The "unit" and "module" in this specification refer to software and/or hardware that can perform a specific function independently or in cooperation with other components, where the hardware may be, for example, an FPGA (Field-Programmable Gate Array), an IC (Integrated Circuit), or the like.

Embodiments of the present invention further provide a computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, implements the method steps for updating the threshold of the semiconductor test program. The computer-readable storage medium may include, but is not limited to, any type of disk including floppy disks, optical disks, DVD, CD-ROMs, microdrive, and magneto-optical disks, ROMs, RAMs, EPROMs, EEPROMs, DRAMs, VRAMs, flash memory devices, magnetic or optical cards, nanosystems (including molecular memory ICs), or any type of media or device suitable for storing instructions and/or data.

Fig. 4 is a schematic diagram of a server according to an embodiment of the present application, and as shown in fig. 4, a computer device of the present application is, for example, a laptop computer, a desktop computer, a workbench, a personal digital assistant, a server, a blade server, a mainframe computer, or other suitable computers. The server of the present application comprises a processor 401, a memory 402, an input device 403 and an output device 404. The processor 401, memory 402, input device 403, and output device 404 may be connected by a bus 405 or otherwise. The memory 402 has stored thereon a computer program that is executable on the processor 401, and the processor 401, when executing the program, implements the server-implemented steps of the method for semiconductor test program threshold updating described above.

The input device 403 may receive input numeric or character information, such as a touch screen, keypad, mouse, track pad, touch pad, pointer, one or more mouse buttons, track ball, joystick, or other input device. The output devices 404 may include a display device, auxiliary lighting devices (e.g., LEDs), and haptic feedback devices (e.g., vibrating motors), among others. Display devices may include, but are not limited to, Liquid Crystal Displays (LCDs), Light Emitting Diode (LED) displays, plasma displays, and touch screens.

In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above-described device embodiments are merely illustrative, for example, the division of the unit is only a logical functional division, and there may be other division ways in actual implementation, such as: multiple units or components may be combined, or may be integrated into another system, or some features may be omitted, or not implemented. In addition, the coupling, direct coupling or communication connection between the components shown or discussed may be through some interfaces, and the indirect coupling or communication connection between the devices or units may be electrical, mechanical or other forms.

All functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may be separately used as one unit, or two or more units may be integrated into one unit; the integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.