1. A method for acquiring a shear wave quality factor of a reservoir is characterized by comprising the following steps:

acquiring input logging data of a reservoir;

acquiring an amplitude spectrum of N dipole shear wave direct waves of the reservoir according to the logging data, wherein N is an integer greater than or equal to 1;

determining an interval meeting preset conditions in the reservoir according to the logging data, and performing numerical simulation according to stratum parameters of the interval in the logging data to obtain a simulated dipole transverse wave array waveform;

obtaining the amplitude value of the simulated N dipole shear wave direct waves according to the simulated dipole shear wave array waveform;

obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves according to the amplitude value of the simulated N dipole shear wave direct waves and the amplitude spectrum of the N dipole shear wave direct waves;

and obtaining the transverse wave quality factor of the reservoir by using the attenuation coefficient spectrum and outputting the transverse wave quality factor.

2. The method according to claim 1, wherein obtaining an attenuation coefficient spectrum of the N direct dipole shear wave according to the amplitude value of the simulated N direct dipole shear wave and the amplitude spectrum of the N direct dipole shear wave comprises:

acquiring a wave front diffusion correction coefficient corresponding to each channel in the amplitude values of the N direct waves of the dipole transverse waves according to the amplitude values of the simulated N direct waves of the dipole transverse waves;

respectively correcting the amplitude spectrum corresponding to each channel in the N channels of direct waves of dipole transverse waves by using the corresponding wavefront diffusion correction coefficient of each channel, and acquiring the corrected amplitude spectrum of the N channels of direct waves of dipole transverse waves;

and obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves by adopting a least square fitting method according to the amplitude spectrum of the N dipole shear wave direct waves and the amplitude spectrum of the corrected N dipole shear wave direct waves.

3. The method according to claim 1 or 2, wherein the interval satisfying the preset condition comprises: the gamma value is less than the preset gamma value, the well diameter does not collapse, the density value does not change suddenly, and the interval of the seamless hole structure in the resistivity imaging graph is formed.

4. The method of claim 1, wherein the formation parameters comprise: density, well diameter, compressional moveout, and shear moveout.

5. The method of claim 1, wherein the obtaining the amplitude values of the simulated N direct waves of the dipole shear wave according to the simulated dipole shear wave array waveform comprises:

obtaining the amplitude value of the direct wave of the simulated N dipole transverse waves according to the following formula (I);

in the formula (I), A_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; wv_iRepresenting the amplitude of the simulated ith dipole shear wave array waveform in a preset time point; tb_iAnd te_iRespectively representing a preset starting time and a preset ending time of the simulated dipole transverse wave array waveform; dt represents the simulated dipole shear array waveform time sampling interval.

6. The method according to claim 2, wherein obtaining the wavefront diffusion correction coefficient corresponding to each of the N direct arrival dipole wave amplitude values according to the simulated N direct arrival dipole wave amplitude values comprises:

acquiring a wave front diffusion correction coefficient corresponding to each channel in the amplitude values of the N channels of direct waves of the dipole transverse wave according to the following formula (II);

in the formula (II), coff_iRepresenting wave front diffusion correction corresponding to amplitude value of ith dipole transverse wave direct waveA coefficient; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; a. the_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; a. the₁And representing the amplitude value of the simulated 1 st dipole transverse wave direct wave.

7. The method according to claim 2, wherein the step of using the wavefront diffusion correction coefficient corresponding to each channel to respectively correct the amplitude spectrum corresponding to each channel of the N direct waves of dipole shear waves to obtain the corrected amplitude spectrum of the N direct waves of dipole shear waves comprises:

acquiring an amplitude spectrum of the corrected N dipole transverse wave direct waves according to the wavefront diffusion correction coefficient corresponding to each channel and the amplitude spectrum corresponding to each channel in the N dipole transverse wave direct waves according to the following formula (III);

AF_ij＝AF′_ij*coff_iformula (III)

In the formula (III), i represents the channel number of the simulated dipole transverse wave direct wave, and is 1-N; j represents any frequency sampling point in the amplitude spectrum corresponding to each of the N dipole transverse wave direct arrivals; AF_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the corrected amplitude spectrum of the ith dipole transverse wave direct wave; AF'_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the amplitude spectrum of the ith dipole shear wave direct wave; coff_iAnd representing the wave front diffusion correction coefficient corresponding to the amplitude value of the ith dipole transverse wave direct wave.

8. The method of claim 1, wherein obtaining the shear wave quality factor of the reservoir using the attenuation coefficient spectrum comprises:

obtaining a shear wave quality factor of the reservoir according to the following formula (IV);

formula (four)) Wherein Q represents the shear wave quality factor of the reservoir; alpha is alpha_jRepresents the attenuation coefficient at the jth frequency sampling point; v. of_sRepresenting the velocity of the dipole transverse wave; df represents the sampling interval of frequency points in the amplitude spectrum of any dipole transverse wave direct wave; fb and fe respectively represent a preset starting frequency and a preset cutoff frequency in the amplitude spectrum of the dipole shear wave direct wave.

9. An electronic device, comprising:

a memory for storing program instructions;

a processor for calling program instructions in the memory to perform the method of shear wave quality factor acquisition for a reservoir according to any one of claims 1 to 8.

10. A computer-readable storage medium, characterized in that the computer storage medium stores a computer program which, when executed by a processor, implements the shear wave quality factor acquisition method of a reservoir as claimed in any one of claims 1 to 8.

Background

The quality factor is an important reservoir physical property parameter and is mainly used for describing attenuation generated when sound waves propagate in rocks or strata. The quality factors are further classified into longitudinal wave quality factors and transverse wave quality factors. The transverse wave quality factor can be used for implementing amplitude recovery on seismic trace data in transverse wave seismic exploration and transverse wave reflected waves in dipole transverse wave far detection, and further processing to obtain a high-precision migration imaging result reflecting geological structures at the deep part of a stratum or far parts out of a well. Therefore, it has important physical significance to accurately obtain the transverse wave quality factor.

The existing method for calculating the transverse wave quality factor usually uses seismic exploration data, and the transverse wave quality factor can be inverted from the transverse wave seismic exploration data or vertical seismic profile data by using a rise time method or a frequency shift method. But the quality factor calculated by the above method has low resolution.

Disclosure of Invention

The embodiment of the application provides a method and a device for acquiring a transverse wave quality factor of a reservoir, which aim to solve the problem of low resolution of the transverse wave quality factor.

In a first aspect, an embodiment of the present application provides a method for obtaining a shear wave quality factor of a reservoir, including:

acquiring input logging data of a reservoir;

acquiring an amplitude spectrum of N dipole shear wave direct waves of the reservoir according to the logging data, wherein N is an integer greater than or equal to 1;

determining an interval meeting preset conditions in the reservoir according to the logging data, and performing numerical simulation according to stratum parameters of the interval in the logging data to obtain a simulated dipole transverse wave array waveform;

obtaining the amplitude value of the simulated N dipole shear wave direct waves according to the simulated dipole shear wave array waveform;

obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves according to the amplitude value of the simulated N dipole shear wave direct waves and the amplitude spectrum of the N dipole shear wave direct waves;

and obtaining the transverse wave quality factor of the reservoir by using the attenuation coefficient spectrum and outputting the transverse wave quality factor.

Optionally, the obtaining, according to the amplitude value of the simulated N direct waves of dipole shear wave and the amplitude spectrum of the N direct waves of dipole shear wave, an attenuation coefficient spectrum of the N direct waves of dipole shear wave includes:

acquiring a wave front diffusion correction coefficient corresponding to each channel in the amplitude values of the N direct waves of the dipole transverse waves according to the amplitude values of the simulated N direct waves of the dipole transverse waves;

respectively correcting the amplitude spectrum corresponding to each channel in the N channels of direct waves of dipole transverse waves by using the corresponding wavefront diffusion correction coefficient of each channel, and acquiring the corrected amplitude spectrum of the N channels of direct waves of dipole transverse waves;

and obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves by adopting a least square fitting method according to the amplitude spectrum of the N dipole shear wave direct waves and the amplitude spectrum of the corrected N dipole shear wave direct waves.

Optionally, the interval meeting the preset condition includes: the gamma value is less than the preset gamma value, the well diameter does not collapse, the density value does not change suddenly, and the interval of the seamless hole structure in the resistivity imaging graph is formed.

Optionally, the formation parameters include: density, well diameter, compressional moveout, and shear moveout.

Optionally, the obtaining, according to the simulated dipole shear array waveform, an amplitude value of a simulated N-channel dipole shear direct wave includes:

and acquiring the amplitude value of the simulated direct wave of the N dipole transverse waves according to the following formula (I).

In the formula (I), A_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; wv_iRepresenting the amplitude of the simulated ith dipole shear wave array waveform in a preset time point; tb_iAnd te_iRespectively representing a preset starting time and a preset ending time of the simulated dipole transverse wave array waveform; dt represents the simulated dipole shear array waveform time sampling interval.

Optionally, obtaining, according to the simulated amplitude value of the N direct waves of dipole shear wave, a wavefront diffusion correction coefficient corresponding to each of the amplitude values of the N direct waves of dipole shear wave, including:

and acquiring the wavefront diffusion correction coefficient corresponding to each channel in the amplitude values of the N channels of direct waves of the dipole transverse wave according to the following formula (II).

In the formula (II), coff_iRepresenting the ith dipole transverse wave directWave front diffusion correction coefficients corresponding to the wave amplitude values; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; a. the_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; a. the₁And representing the amplitude value of the simulated 1 st dipole transverse wave direct wave.

Optionally, the step of respectively correcting the amplitude spectrum corresponding to each of the N direct waves of dipole shear wave by using the wavefront diffusion correction coefficient corresponding to each of the N channels of direct waves of dipole shear wave to obtain the corrected amplitude spectrum of the N direct waves of dipole shear wave includes:

and acquiring the corrected amplitude spectrum of the N dipole transverse wave direct waves according to the wavefront diffusion correction coefficient corresponding to each channel and the amplitude spectrum corresponding to each channel in the N dipole transverse wave direct waves according to the following formula (III).

AF_ij＝AF’_ij*coff_iFormula (III)

In the formula (III), i represents the channel number of the simulated dipole transverse wave direct wave, and is 1-N; j represents any frequency sampling point in the amplitude spectrum corresponding to each of the N dipole transverse wave direct arrivals; AF_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the corrected amplitude spectrum of the ith dipole transverse wave direct wave; AF'_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the amplitude spectrum of the ith dipole shear wave direct wave; coff_iAnd representing the wave front diffusion correction coefficient corresponding to the amplitude value of the ith dipole transverse wave direct wave.

Optionally, obtaining a shear wave quality factor of the reservoir by using the attenuation coefficient spectrum includes:

and (4) obtaining a shear wave quality factor of the reservoir according to the following formula (IV).

In the formula (IV), Q represents the transverse wave quality factor of the reservoir; alpha is alpha_jRepresenting the attenuation coefficient of the amplitude spectrum of the N dipole shear wave direct waves at the j frequency sampling point；v_sRepresenting the velocity of the dipole transverse wave; df represents the sampling interval of frequency points in the amplitude spectrum of any dipole transverse wave direct wave; fb and fe respectively represent a preset starting frequency and a preset cutoff frequency in the amplitude spectrum of the dipole shear wave direct wave.

In a second aspect, an embodiment of the present application provides an apparatus for acquiring a shear wave quality factor of a reservoir, including:

the first acquisition module is used for acquiring input logging data of a reservoir;

the second acquisition module is used for acquiring an amplitude spectrum of N dipole transverse wave direct waves of the reservoir according to the logging data, wherein N is an integer greater than or equal to 1;

the simulation module is used for determining an interval meeting preset conditions in the reservoir according to the logging data, performing numerical simulation according to stratum parameters of the interval in the logging data to obtain a simulated dipole shear wave array waveform, and acquiring amplitude values of simulated N dipole shear wave direct arrival waves according to the simulated dipole shear wave array waveform;

the processing module is used for obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves according to the amplitude value of the simulated N dipole shear wave direct waves and the amplitude spectrum of the N dipole shear wave direct waves, and obtaining a shear wave quality factor of the reservoir by using the attenuation coefficient spectrum;

and the output module is used for outputting the transverse wave quality factor.

Optionally, the processing module is specifically configured to:

acquiring a wave front diffusion correction coefficient corresponding to each channel in the amplitude values of the N direct waves of the dipole transverse waves according to the amplitude values of the simulated N direct waves of the dipole transverse waves;

respectively correcting the amplitude spectrum corresponding to each channel in the N channels of direct waves of dipole transverse waves by using the corresponding wavefront diffusion correction coefficient of each channel, and acquiring the corrected amplitude spectrum of the N channels of direct waves of dipole transverse waves;

and obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves by adopting a least square fitting method according to the amplitude spectrum of the N dipole shear wave direct waves and the amplitude spectrum of the corrected N dipole shear wave direct waves.

Optionally, the interval meeting the preset condition includes: the gamma value is less than the preset gamma value, the well diameter does not collapse, the density value does not change suddenly, and the interval of the seamless hole structure in the resistivity imaging graph is formed.

Optionally, the formation parameters include: density, well diameter, compressional moveout, and shear moveout.

Optionally, the simulation module is specifically configured to:

and acquiring the amplitude value of the simulated direct wave of the N dipole transverse waves according to the following formula (I).

In the formula (I), A_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; wv_iRepresenting the amplitude of the simulated ith dipole shear wave array waveform in a preset time point; tb_iAnd te_iRespectively representing a preset starting time and a preset ending time of the simulated dipole transverse wave array waveform; dt represents the simulated dipole shear array waveform time sampling interval.

Optionally, the processing module is specifically configured to:

and acquiring the wavefront diffusion correction coefficient corresponding to each channel in the amplitude values of the N channels of direct waves of the dipole transverse wave according to the following formula (II).

In the formula (II), coff_iRepresenting a wave front diffusion correction coefficient corresponding to the amplitude value of the ith dipole transverse wave direct wave; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; a. the_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; a. the₁And representing the amplitude value of the simulated 1 st dipole transverse wave direct wave.

Optionally, the processing module is specifically configured to:

and acquiring the corrected amplitude spectrum of the N dipole transverse wave direct waves according to the wavefront diffusion correction coefficient corresponding to each channel and the amplitude spectrum corresponding to each channel in the N dipole transverse wave direct waves according to the following formula (III).

AF_ij＝AF’_ij*coff_iFormula (III)

In the formula (III), i represents the channel number of the simulated dipole transverse wave direct wave, and is 1-N; j represents any frequency sampling point in the amplitude spectrum corresponding to each of the N dipole transverse wave direct arrivals; AF_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the corrected amplitude spectrum of the ith dipole transverse wave direct wave; AF'_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the amplitude spectrum of the ith dipole shear wave direct wave; coff_iAnd representing the wave front diffusion correction coefficient corresponding to the amplitude value of the ith dipole transverse wave direct wave.

Optionally, the processing module is specifically configured to:

and (4) obtaining a shear wave quality factor of the reservoir according to the following formula (IV).

In the formula (IV), Q represents the transverse wave quality factor of the reservoir; alpha is alpha_jRepresenting the attenuation coefficient of the N dipole shear wave direct wave amplitude spectrums at the jth frequency sampling point; v. of_sRepresenting the velocity of the dipole transverse wave; df represents the sampling interval of frequency points in the amplitude spectrum of any dipole transverse wave direct wave; fb and fe respectively represent a preset starting frequency and a preset cutoff frequency in the amplitude spectrum of the dipole shear wave direct wave.

In a third aspect, an embodiment of the present application provides an electronic device, including:

a memory for storing program instructions;

and the processor is used for calling the program instructions in the memory and executing the method for acquiring the shear wave quality factor of the reservoir according to the first aspect of the application.

In a fourth aspect, embodiments of the present application provide a computer-readable storage medium, where a computer program is stored, and the computer program, when executed by a processor, implements the method for obtaining shear wave quality factor of a reservoir according to the first aspect of the present application.

In a fifth aspect, this application embodiment provides a program product, where the program product includes a computer program, where the computer program is stored in a readable storage medium, and at least one processor of an electronic device may read the computer program from the readable storage medium, and the at least one processor executes the computer program to enable the electronic device to implement the method for acquiring a shear wave quality factor of a reservoir according to the first aspect as described in this application embodiment.

According to the method and the device for acquiring the transverse wave quality factor of the reservoir, N dipole transverse wave direct wave amplitude spectrums of the reservoir are acquired according to the acquired logging data of the input reservoir; determining an interval meeting preset conditions in the reservoir according to the logging data, and performing numerical simulation according to stratum parameters of the interval in the logging data to obtain a simulated dipole transverse wave array waveform; obtaining the amplitude value of the simulated N dipole transverse wave direct waves according to the simulated dipole transverse wave array waveform; then obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves according to the amplitude value of the simulated N dipole shear wave direct waves and the amplitude spectrum of the N dipole shear wave direct waves; and finally, obtaining the transverse wave quality factor of the reservoir by using the attenuation coefficient spectrum and outputting the transverse wave quality factor.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.

Fig. 1 is a schematic view of an application scenario provided in an embodiment of the present application;

fig. 2 is a schematic flow chart of a method for obtaining a shear wave quality factor of a reservoir according to an embodiment of the present disclosure;

FIG. 3 is a schematic diagram illustrating a comprehensive analysis of the input well log data of the reservoir provided by an embodiment of the present application;

fig. 4 is a schematic flow chart of a method for acquiring a shear wave quality factor of a reservoir according to another embodiment of the present disclosure;

FIG. 5 is a schematic diagram of a simulated dipole shear array waveform according to another embodiment of the present application;

FIG. 6 is a diagram illustrating a relationship between a wavefront spread correction coefficient and a source distance according to another embodiment of the present application;

fig. 7 is a schematic structural diagram of a shear wave quality factor obtaining apparatus for a reservoir according to an embodiment of the present disclosure;

fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present application;

fig. 9 is a schematic structural diagram of a terminal device according to another embodiment of the present application;

fig. 10 is a schematic structural diagram of a server according to another embodiment of the present application.

Detailed Description

Acoustic waves attenuate when propagating in the rock or formation. Attenuation is generally divided into two categories: one is the attenuation produced by the continuous divergence of acoustic energy as the propagation path grows, which is called geometric diffusion attenuation or wavefront diffusion attenuation; another is that because of the inelastic nature of rock, sound waves cause relative motion of rock particles, pore fluids, fracture surfaces, etc. during propagation, such that the sound wave energy is converted from mechanical energy to thermal energy to produce attenuation, commonly referred to as the inherent attenuation of the rock. The quality factor is an important parameter for describing the inherent attenuation of the rock, and when the rock is represented by an ideal complete elastic medium, the value of the quality factor tends to be infinite; the stronger the rock inelastic properties, the smaller the quality factor value. The quality factors are further classified into longitudinal wave quality factors and transverse wave quality factors.

The accurate determination of the transverse wave quality factor has important physical significance: the method can be used for implementing amplitude recovery on seismic trace data in transverse wave seismic exploration and transverse wave reflected waves in dipole transverse wave far detection, and further processing to obtain a high-precision offset imaging result reflecting geological structures deep in the stratum or far out of the well.

At present, there are three main data sources for calculating the shear wave quality factor: the method comprises the following steps of drilling a rock core, transverse wave seismic exploration data and vertical seismic section data underground, obtaining a transverse wave waveform by performing a rock physics experiment, particularly a sound wave experiment on the rock core, and then calculating a transverse wave attenuation factor of the rock core by adopting methods such as a spectral ratio method and the like, wherein the rock core is high in cost, and coring at each well and a whole well section is not practical; the shear wave quality factor can be inverted from shear wave seismic survey data or vertical seismic profile data using a rise time method or a frequency shift method, but the quality factor resolution calculated therefrom is low and is an integrated contribution of the formation of several kilometers. Therefore, it is highly desirable to find a method for calculating the shear wave quality factor with high resolution, low measurement cost, and no damage to the well.

Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present application, as detailed in the appended claims.

The embodiment of the present application may be applied to an electronic device, and fig. 1 is a schematic view of an application scenario provided in an embodiment of the present application, as shown in fig. 1, the electronic device may include, for example, a server, a computer, a mobile terminal, and the like, and the mobile terminal includes: cell-phone, panel computer, wearable equipment etc. do not do the restriction to this application.

The technical solution of the present application is described below with reference to several specific embodiments.

Fig. 2 is a schematic flow chart of a method for acquiring a shear wave quality factor of a reservoir according to an embodiment of the present disclosure, and as shown in fig. 2, the method according to an embodiment of the present disclosure may include:

s201, acquiring input logging data of the reservoir.

Acquiring input logging data of a reservoir, wherein the logging data comprises: conventional logging data, electrical imaging logging data, dipole shear logging data, and the like. The conventional well log data may include nine conventional well logs: the system comprises a natural gamma curve, a well diameter curve, a natural potential curve, a longitudinal wave time difference curve, a compensation neutron curve, a density curve, a microelectrode resistivity curve, a deep resistivity curve and a shallow resistivity curve, wherein the nine logging curves can be directly obtained in the logging process.

For example, fig. 3 is a schematic diagram of comprehensive analysis of the input logging data of the reservoir according to an embodiment of the present application. Through comprehensive analysis of the above logging data of the input reservoir, a logging curve of the input reservoir shown in fig. 3 can be obtained, as shown in fig. 3, a first path is a lithology indicator path, which includes a natural gamma curve and a hole diameter curve; the second path is a depth curve; the third is a density curve; and the fourth path is a time difference curve path, wherein the longitudinal wave time difference curve is a direct measurement result of conventional well logging, and the transverse wave time difference curve can be obtained from N dipole well logging waveforms after conventional processing by using a time-slowness correlation method, wherein N is an integer greater than or equal to 1. The time-slowness correlation method can be described in the related art, and is not described herein again.

S202, acquiring an amplitude spectrum of N dipole shear wave direct waves of the reservoir according to the logging data, wherein N is an integer greater than or equal to 1.

According to the input logging data of the reservoir acquired in S201, first, the N dipole logging waveforms of the reservoir are conventionally processed, and the N dipole shear direct arrival waves of the reservoir are acquired. And then carrying out Fourier transform on the N dipole transverse wave direct waves of the reservoir to obtain the amplitude spectrum of the input N dipole transverse wave direct waves of the reservoir. For example, the fifth trace in FIG. 3 shows the amplitude spectrum of the N-way direct dipole shear waves of the measured reservoir, and it can be seen that the energy of the N-way direct dipole shear waves of the reservoir is mainly distributed in the frequency range of 3000Hz-5500 Hz. The conventional processing of the N-channel dipole logging waveforms of the reservoir includes gain correction and delay correction, and specific implementation processes of the gain correction and the delay correction may be described in the related art and are not described herein again.

S203, determining an interval meeting preset conditions in the reservoir according to the logging data, and performing numerical simulation according to the stratum parameters of the interval in the logging data to obtain a simulated dipole shear wave array waveform.

First, according to the input logging data of the reservoir acquired in S201, an interval meeting a preset condition in the reservoir may be acquired.

Optionally, the interval with the preset condition may be an interval with relatively pure lithology in the input reservoir and a seamless hole structure in the input reservoir. In this embodiment, the preset condition may be: the interval with lower gamma value (less than 20API), no collapse of well diameter and no mutation of density value. For example, as shown in fig. 3, the intervals in the rectangular area are, as can be derived from fig. 3, the intervals meeting the preset condition are: and the well depth is 7246m-7252m, and the lithology of the input reservoir in the interval is pure (the first natural gamma curve is low) and no borehole collapse (the first borehole diameter curve).

And then, selecting any depth point in the interval according to the interval meeting preset conditions in the reservoir, and carrying out numerical simulation according to the formation parameters of the interval in the logging data to obtain a simulated dipole shear wave array waveform.

Optionally, the formation parameters for the interval may include density of selected depth points within the interval, borehole diameter, compressional and shear moveout. For example, according to the interval with the depth of 7246m to 7252m, a depth point of 7248m in the interval is selected, and the formation parameters corresponding to the depth point are obtained according to the logging data, for example, the formation parameters at the position of the interval 7248m are as follows: the density value was 2.71g/cm3, the caliper value was 7.1in, the longitudinal wavelenght difference (49.5 μ s/ft), and the transverse wavelenght difference (96.3 μ s/ft), and then numerical simulations were performed based on the formation parameters.

The transverse wave time difference can be extracted from a dipole transverse wave array waveform obtained by performing conventional processing on logging data by adopting a time-slowness correlation method, a correlation function array of the dipole transverse wave array waveform is calculated on two dimensions of time and slowness, and the slowness where the maximum function value is located is the dipole transverse wave time difference.

Alternatively, the numerical simulation method may be a real-axis integration method or a finite difference method. The real-axis integration method or the finite difference method can be referred to the description in the related art, and will not be described herein.

Optionally, the formation parameters of the interval may further include a source distance corresponding to the N dipole shear wave waveforms. Typically a real dipole logging tool measures N dipole shear waveforms at each depth position, which have different source spacings that can also be used as formation parameters.

And S204, acquiring the amplitude value of the simulated N-channel direct waves of the dipole shear wave according to the simulated dipole shear wave array waveform.

And according to the simulated dipole shear wave array waveform obtained in S203, respectively processing N dipole shear wave direct waves in the simulated dipole shear wave array waveform, and obtaining an amplitude value of the simulated N dipole shear wave direct waves.

S205, obtaining an N-channel dipole shear wave direct wave attenuation coefficient spectrum according to the amplitude value of the simulated N-channel dipole shear wave direct wave and the amplitude spectrum of the N-channel dipole shear wave direct wave.

And obtaining an attenuation coefficient spectrum of the amplitude spectrum of the N dipole shear wave direct waves according to the amplitude values of the simulated N dipole shear wave direct waves obtained in the S204 and the amplitude spectrum of the N dipole shear wave direct waves of the reservoir layer obtained in the S202.

S206, obtaining the transverse wave quality factor of the reservoir and outputting the transverse wave quality factor by using the attenuation coefficient spectrum.

And obtaining the transverse wave quality factor of the reservoir according to the attenuation coefficient spectrum of the amplitude spectrum of the N dipole transverse wave direct waves obtained in the S204. After the shear wave quality factor of the reservoir is obtained, the obtained shear wave quality factor of the reservoir is sent to corresponding display equipment, and the shear wave quality factor of the reservoir is displayed through the display equipment or is directly displayed through self equipment. The display device may be a terminal device, such as a computer, a mobile phone, and the like, which is not limited in this application.

In this embodiment, an amplitude spectrum of N dipole shear wave direct waves of the reservoir is obtained according to the obtained logging data of the reservoir; determining an interval meeting preset conditions in the reservoir according to the logging data, and performing numerical simulation according to stratum parameters of the interval in the logging data to obtain a simulated dipole transverse wave array waveform; after obtaining a simulated dipole shear wave array waveform, obtaining the amplitude value of the simulated N dipole shear wave direct waves according to the simulated dipole shear wave array waveform; then obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves according to the amplitude value of the simulated N dipole shear wave direct waves and the amplitude spectrum of the N dipole shear wave direct waves; and finally, obtaining the transverse wave quality factor of the reservoir by using the attenuation coefficient spectrum and outputting the transverse wave quality factor.

In some embodiments, fig. 4 is a schematic flow chart of a method for acquiring a shear wave quality factor of a reservoir according to another embodiment of the present disclosure, and as shown in fig. 4, the method according to an embodiment of the present disclosure may include:

s401, obtaining input logging data of the reservoir.

S402, obtaining an amplitude spectrum of the N dipole shear wave direct waves of the reservoir according to the logging data.

S403, determining an interval meeting preset conditions in the reservoir according to the logging data, and performing numerical simulation according to the stratum parameters of the interval in the logging data to obtain a simulated dipole shear wave array waveform.

The specific implementation process of S401-S403 may refer to the related description in the embodiment shown in fig. 2, and is not described herein again.

S404, obtaining the amplitude value of the simulated N-channel direct waves of the dipole shear wave according to the simulated dipole shear wave array waveform.

Optionally, one possible implementation manner of S404 is:

according to the following formula 1, the amplitude value of the simulated direct wave of the N-channel dipole shear wave is obtained.

In this embodiment, a time window is set according to the simulated dipole shear wave array waveform obtained in S403, N dipole shear wave direct waves in the simulated dipole shear wave array waveform are respectively calculated, and the amplitude value of the simulated N dipole shear wave direct waves is obtained as shown in formula 1.

In formula 1, A_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; wv_iRepresenting the amplitude of the simulated ith dipole shear wave array waveform in a preset time point; tb_iAnd te_iRespectively representing a preset starting time and a preset ending time of the simulated dipole transverse wave array waveform; dt represents the simulated dipole shear array waveform time sampling interval.

A simulated dipole shear wave array waveform obtained in the above manner is shown in fig. 5, for example.

Eight dipole transverse wave direct waves are taken as an example for explanation. For example, the eight dipole shear wave array waveforms obtained after the numerical simulation is performed according to the formation parameters in step S403, and the eight dipole shear wave direct wave amplitude values (dimensionless) corresponding to the eight dipole array waveforms can be calculated by using formula 1, where the values are: 192. 190.3, 188.2, 184.4, 179.4, 173, 167, 161.1.

S405, acquiring a wave front diffusion correction coefficient corresponding to each channel in the amplitude values of the N channels of direct waves of the dipole transverse waves according to the amplitude values of the simulated N channels of direct waves of the dipole transverse waves.

According to the amplitude values of the simulated N direct waves of the dipole shear wave acquired in the step S404, the wavefront diffusion correction coefficient corresponding to each direct wave of the dipole shear wave in the amplitude values of the N direct waves of the dipole shear wave is respectively calculated.

Optionally, one possible implementation manner of S405 is:

and acquiring the wavefront diffusion correction coefficient corresponding to each channel in the amplitude values of the N channels of direct waves of the dipole transverse wave according to the following formula 2.

The amplitude values of the simulated N-channel direct dipole-shear wave acquired in the above step S404 are compared. By using the following formula 2, the wavefront diffusion correction coefficient corresponding to each direct wave of dipole shear wave in the amplitude values of the N direct waves of dipole shear wave can be respectively calculated, and the calculation is shown in the formula 2.

In equation 2, coff_iRepresenting a wave front diffusion correction coefficient corresponding to the amplitude value of the ith dipole transverse wave direct wave; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; a. the_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; a. the₁And representing the amplitude value of the simulated 1 st dipole transverse wave direct wave.

For example, taking eight dipole shear direct arrival waves as an example, according to the eight dipole shear direct arrival wave amplitude values (dimensionless) corresponding to the simulated eight dipole array waveforms acquired in the above step S404: 192. 190.3, 188.2, 184.4, 179.4, 173, 167, 161.1, and calculating the wavefront diffusion correction coefficients corresponding to the amplitudes of the eight dipole direct waves by using the formula 2, which are respectively: 1. 1.009, 1.02, 1.041, 1.07, 1.11, 1.15, 1.192.

Fig. 6 shows a relationship between the wavefront diffusion correction coefficient corresponding to each channel in the N amplitude values of the direct waves of dipole shear waves obtained in the above manner and the source distance.

S406, correcting the amplitude spectrum corresponding to each of the N dipole transverse wave direct waves by using the corresponding wavefront diffusion correction coefficient of each channel, and acquiring the corrected amplitude spectrum of the N dipole transverse wave direct waves.

According to the wavefront diffusion correction coefficient corresponding to each of the N direct amplitude values of the dipole shear wave obtained in step S405, the amplitude spectrum corresponding to each of the N direct amplitude values of the dipole shear wave can be corrected, so as to obtain the corrected amplitude spectrum of the N direct amplitude values of the dipole shear wave.

Optionally, one possible implementation manner of S406 is:

and acquiring the corrected amplitude spectrum of the N dipole transverse wave direct waves according to the formula 3 and the wavefront diffusion correction coefficient corresponding to each channel and the amplitude spectrum corresponding to each channel in the N dipole transverse wave direct waves.

In this embodiment, for the wavefront diffusion correction coefficient corresponding to each of the N dipole shear direct wave amplitude values obtained in step S404 and the amplitude spectrum corresponding to each of the N dipole shear direct waves, the following formula 3 is used to obtain the amplitude spectrum of the N dipole shear direct waves after correction.

AF_ij＝AF’_ij*coff_iEquation 3

In formula 3, i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; j represents any frequency sampling point in the amplitude spectrum corresponding to each of the N dipole transverse wave direct arrivals; AF_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the corrected amplitude spectrum of the ith dipole transverse wave direct wave; AF'_ijRepresenting the amplitude of the ith dipole shear wave direct waveThe amplitude corresponding to the jth frequency sampling point in the spectrum; coff_iAnd representing the wave front diffusion correction coefficient corresponding to the amplitude value of the ith dipole transverse wave direct wave.

For example, taking eight dipole shear wave direct waves as an example, the wavefront diffusion correction may be performed on the amplitude spectrum corresponding to the measured dipole shear wave direct wave shown in the fifth trace in fig. 3 according to the wavefront diffusion correction coefficient shown in fig. 6, so as to correct and compensate the energy lost by the measured dipole shear wave direct wave in the propagation process, the fifth trace in fig. 3 shows the amplitude spectrum corresponding to the measured dipole shear wave direct wave, and the amplitude spectrum of the corrected eight dipole shear wave direct waves is calculated by formula 3.

S407, obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves by adopting a least square fitting method according to the amplitude spectrum of the N dipole shear wave direct waves and the amplitude spectrum of the corrected N dipole shear wave direct waves.

And calculating the amplitude spectrum of the corrected N dipole shear wave direct waves obtained in the step S406 by adopting a least square fitting method, and obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves.

Wherein the least squares fitting method comprises: and performing least square fitting on the N amplitude values corresponding to each frequency sampling point in the corrected amplitude spectrum of the direct wave of the dipole transverse wave. In this embodiment, eight dipole direct waves are taken as an example for explanation. After performing least square fitting on the amplitude spectrum of the eight corrected dipole shear wave direct waves, the source distances corresponding to the eight corrected dipole shear wave direct waves can be obtained, specifically: [ SP ]₁,SP₂,SP₃,SP₄,SP₅,SP₆,SP₇,SP₈]The logarithm value of the eight amplitude values corresponding to any frequency sampling point is specifically as follows: [ ln (AF)_1j),ln(AF_2j),ln(AF_3j),ln(AF_4j),ln(AF_5j),ln(AF_6j),ln(AF_7j),ln(AF_8j)]Then, the slope of the least square fitting straight line after the least square fitting is the attenuation coefficient spectrum alpha corresponding to any frequency sampling point_j. Said attenuation coefficient spectrumα_jCan be calculated according to equation 4.

In formula 4, α_jRepresenting the attenuation coefficient of the N dipole transverse wave direct wave amplitude spectrums at the frequency j, wherein the unit of the attenuation coefficient is Np/m; SP_nRepresenting the source distance corresponding to the nth dipole transverse wave direct arrival wave; SP_mRepresenting the source distance corresponding to the mth dipole transverse wave direct arrival wave; AF_mjRepresenting the amplitude of the amplitude spectrum of the mth dipole shear wave direct wave at the jth frequency; AF_njRepresenting the amplitude of the amplitude spectrum of the nth dipole shear wave direct wave at the jth frequency; and m and N are respectively the number of channels corresponding to the N channels of dipole transverse wave direct arrival waves.

And S408, obtaining the transverse wave quality factor of the reservoir by using the attenuation coefficient spectrum and outputting the transverse wave quality factor.

In some embodiments, one possible implementation of S408 is:

and obtaining the shear wave quality factor of the reservoir according to the following formula 5.

In formula 5, Q represents the shear wave quality factor of the reservoir; alpha is alpha_jRepresenting the attenuation coefficient of the N dipole shear wave direct wave amplitude spectrums at the jth frequency sampling point; v. of_sRepresenting the velocity of the dipole transverse wave; df represents the sampling interval of frequency points in the amplitude spectrum of any dipole transverse wave direct wave; fb and fe respectively represent a preset starting frequency and a preset cutoff frequency in the amplitude spectrum of the dipole shear wave direct wave.

For example, the transverse wave quality factor corresponding to each depth record point in the reservoir, such as the transverse wave quality factor versus depth curve shown in fig. 3, can be obtained by using the above steps S401 to S407. In the embodiment, when the wave front diffusion correction coefficient is calculated, the stratum parameters corresponding to the position of 7248m in depth of the seamless hole structure in the well with pure lithology are selected. Therefore, the shear wave quality factor at the position of the depth 7248m can be calculated to be 263 according to the formula 5 and the above parameters, and the quality factor can be used as the representative value of the formation corresponding to the interval.

In this embodiment, an amplitude spectrum of N dipole shear wave direct waves of the reservoir is obtained according to the obtained input logging data of the reservoir; determining an interval with pure lithology and a seamless hole structure in the reservoir according to the logging data, and performing numerical simulation according to the formation parameters of the interval in the logging data to obtain a simulated dipole transverse wave array waveform; obtaining the amplitude value of the simulated N dipole transverse wave direct waves according to the simulated dipole transverse wave array waveform; then acquiring a wave front diffusion correction coefficient corresponding to each channel in the amplitude values of the N direct waves of the dipole transverse waves according to the amplitude values of the simulated N direct waves of the dipole transverse waves; respectively correcting the amplitude spectrum corresponding to each of the N dipole transverse wave direct waves by using the corresponding wavefront diffusion correction coefficient of each channel to obtain the corrected amplitude spectrum of the N dipole transverse wave direct waves; obtaining an attenuation coefficient spectrum of the N dipole transverse wave direct waves by adopting a least square fitting method according to the amplitude spectrum of the N dipole transverse wave direct waves and the amplitude spectrum of the corrected N dipole transverse wave direct waves; and finally, obtaining the transverse wave quality factor of the reservoir by using the attenuation coefficient spectrum and outputting the transverse wave quality factor. According to the method, the wave front diffusion coefficient of the dipole transverse wave direct wave is calculated by using a numerical simulation method, and the transverse wave quality factor is calculated by using the dipole transverse wave direct wave in the dipole logging waveform, so that the resolution of the quality factor is improved.

Fig. 7 is a schematic structural diagram of a device for acquiring a shear wave quality factor of a reservoir according to an embodiment of the present disclosure, and as shown in fig. 7, the device 700 according to an embodiment of the present disclosure may include: a first obtaining module 710, a second obtaining module 720, a simulation module 730, a processing module 740, and an output module 750.

The first obtaining module 710 is configured to obtain input logging data of the reservoir.

The second obtaining module 720 is configured to obtain, according to the logging data, an amplitude spectrum of N dipole shear wave direct waves of the reservoir, where N is an integer greater than or equal to 1.

The simulation module 730 is configured to determine, according to the logging data, an interval in the reservoir that meets a preset condition, perform numerical simulation according to formation parameters of the interval in the logging data, obtain a simulated dipole shear wave array waveform, and obtain an amplitude value of the simulated N dipole shear wave direct waves according to the simulated dipole shear wave array waveform.

The processing module 740 is configured to obtain an attenuation coefficient spectrum of the N direct waves of the dipole shear wave according to the amplitude value of the simulated N direct waves of the dipole shear wave and the amplitude spectrum of the N direct waves of the dipole shear wave, and obtain a shear wave quality factor of the reservoir.

The output module 750 is configured to output the shear wave quality factor.

Optionally, the processing module 740 is specifically configured to:

acquiring a wave front diffusion correction coefficient corresponding to each channel in the amplitude values of the N direct waves of the dipole transverse waves according to the amplitude values of the simulated N direct waves of the dipole transverse waves;

respectively correcting the amplitude spectrum corresponding to each channel in the N channels of direct waves of dipole transverse waves by using the corresponding wavefront diffusion correction coefficient of each channel, and acquiring the corrected amplitude spectrum of the N channels of direct waves of dipole transverse waves;

and obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves by adopting a least square fitting method according to the amplitude spectrum of the N dipole shear wave direct waves and the amplitude spectrum of the corrected N dipole shear wave direct waves.

Optionally, the interval meeting the preset condition includes: the gamma value is less than the preset gamma value, the well diameter does not collapse, the density value does not change suddenly, and the interval of the seamless hole structure in the resistivity imaging graph is formed.

Optionally, the formation parameters include: density, well diameter, compressional moveout, and shear moveout.

Optionally, the simulation module 730 is specifically configured to:

and acquiring the amplitude value of the simulated direct wave of the N dipole transverse waves according to the following formula (I).

In the formula (I), A_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; wv_iRepresenting the amplitude of the simulated ith dipole shear wave array waveform in a preset time point; tb_iAnd te_iRespectively representing a preset starting time and a preset ending time of the simulated dipole transverse wave array waveform; dt represents the simulated dipole shear array waveform time sampling interval.

Optionally, the processing module 740 is specifically configured to:

and acquiring the wavefront diffusion correction coefficient corresponding to each channel in the amplitude values of the N channels of direct waves of the dipole transverse wave according to the following formula (II).

In the formula (II), coff_iRepresenting a wave front diffusion correction coefficient corresponding to the amplitude value of the ith dipole transverse wave direct wave; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; a. the_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; a. the₁And representing the amplitude value of the simulated 1 st dipole transverse wave direct wave.

Optionally, the processing module 740 is specifically configured to:

and acquiring the corrected amplitude spectrum of the N dipole transverse wave direct waves according to the wavefront diffusion correction coefficient corresponding to each channel and the amplitude spectrum corresponding to each channel in the N dipole transverse wave direct waves according to the following formula (III).

AF_ij＝AF’_ij*coff_iFormula (III)

In the formula (III), i represents the channel number of the simulated dipole transverse wave direct wave, and is 1-N; j represents any frequency sampling point in the amplitude spectrum corresponding to each of the N dipole transverse wave direct arrivals; AF_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the corrected amplitude spectrum of the ith dipole transverse wave direct wave; AF'_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the amplitude spectrum of the ith dipole shear wave direct wave; coff_iAnd representing the wave front diffusion correction coefficient corresponding to the amplitude value of the ith dipole transverse wave direct wave.

Optionally, the processing module 740 is specifically configured to:

and (5) obtaining a shear wave quality factor of the reservoir according to the following formula (III).

In the formula (IV), Q represents the transverse wave quality factor of the reservoir; alpha is alpha_jRepresenting the attenuation coefficient of the N dipole shear wave direct wave amplitude spectrums at the jth frequency sampling point; v. of_sRepresenting the velocity of the dipole transverse wave; df represents the sampling interval of frequency points in the amplitude spectrum of any dipole transverse wave direct wave; fb and fe respectively represent a preset starting frequency and a preset cutoff frequency in the amplitude spectrum of the dipole shear wave direct wave.

The apparatus of this embodiment may be configured to implement the technical solutions of the above method embodiments, and the implementation principle and the technical effect are similar, which are not described herein again.

Fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present application, and as shown in fig. 8, an electronic device 800 according to this embodiment may include: memory 810, processor 820.

A memory 810 for storing program instructions;

a processor 820, for calling and executing the program instructions in the memory, and executing:

acquiring input logging data of a reservoir;

acquiring an amplitude spectrum of N dipole shear wave direct waves of the reservoir according to the logging data, wherein N is an integer greater than or equal to 1;

determining an interval meeting preset conditions in the reservoir according to the logging data, and performing numerical simulation according to stratum parameters of the interval in the logging data to obtain a simulated dipole transverse wave array waveform;

obtaining the amplitude value of the simulated N dipole shear wave direct waves according to the simulated dipole shear wave array waveform;

obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves according to the amplitude value of the simulated N dipole shear wave direct waves and the amplitude spectrum of the N dipole shear wave direct waves;

and obtaining the transverse wave quality factor of the reservoir by using the attenuation coefficient spectrum and outputting the transverse wave quality factor.

Optionally, the processor 820 is specifically configured to:

acquiring a wave front diffusion correction coefficient corresponding to each channel in the amplitude values of the N direct waves of the dipole transverse waves according to the amplitude values of the simulated N direct waves of the dipole transverse waves;

respectively correcting the amplitude spectrum corresponding to each channel in the N channels of direct waves of dipole transverse waves by using the corresponding wavefront diffusion correction coefficient of each channel, and acquiring the corrected amplitude spectrum of the N channels of direct waves of dipole transverse waves;

and obtaining an attenuation coefficient spectrum of the N dipole shear wave direct waves by adopting a least square fitting method according to the amplitude spectrum of the N dipole shear wave direct waves and the amplitude spectrum of the corrected N dipole shear wave direct waves.

Optionally, the interval meeting the preset condition includes: the gamma value is less than the preset gamma value, the well diameter does not collapse, the density value does not change suddenly, and the interval of the seamless hole structure in the resistivity imaging graph is formed.

Optionally, the formation parameters include: density, well diameter, compressional moveout, and shear moveout.

Optionally, the processor 820 is specifically configured to:

and acquiring the amplitude value of the simulated direct wave of the N dipole transverse waves according to the following formula (I).

In the formula (I), A_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; wv_iRepresenting the amplitude of the simulated ith dipole shear wave array waveform in a preset time point; tb_iAnd te_iRespectively representing a preset starting time and a preset ending time of the simulated dipole transverse wave array waveform; dt represents the simulated dipole shear array waveform time sampling interval.

Optionally, the processor 820 is specifically configured to:

and acquiring the wavefront diffusion correction coefficient corresponding to each channel in the amplitude values of the N channels of direct waves of the dipole transverse wave according to the following formula (II).

In the formula (II), coff_iRepresenting a wave front diffusion correction coefficient corresponding to the amplitude value of the ith dipole transverse wave direct wave; i represents the channel number of the simulated dipole transverse wave direct wave, and i is 1 to N; a. the_iRepresenting the amplitude value of the simulated ith dipole shear direct wave; a. the₁And representing the amplitude value of the simulated 1 st dipole transverse wave direct wave.

Optionally, the processor 820 is specifically configured to:

and acquiring the corrected amplitude spectrum of the N dipole transverse wave direct waves according to the wavefront diffusion correction coefficient corresponding to each channel and the amplitude spectrum corresponding to each channel in the N dipole transverse wave direct waves according to the following formula (III).

AF_ij＝AF’_ij*coff_iFormula (III)

In the formula (III), i represents the channel number of the simulated dipole transverse wave direct wave, and is 1-N; j represents any frequency sampling point in the amplitude spectrum corresponding to each of the N dipole transverse wave direct arrivals; AF_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the corrected amplitude spectrum of the ith dipole transverse wave direct wave; AF'_ijRepresenting the amplitude corresponding to the jth frequency sampling point in the amplitude spectrum of the ith dipole shear wave direct wave; coff_iAnd representing the wave front diffusion correction coefficient corresponding to the amplitude value of the ith dipole transverse wave direct wave.

Optionally, the processor 820 is specifically configured to:

and (4) obtaining a shear wave quality factor of the reservoir according to the following formula (IV).

In the formula (IV), Q represents the transverse wave quality factor of the reservoir; alpha is alpha_jRepresenting the attenuation coefficient of the N dipole shear wave direct wave amplitude spectrums at the jth frequency sampling point; v. of_sRepresenting the velocity of the dipole transverse wave; df represents the sampling interval of frequency points in the amplitude spectrum of any dipole transverse wave direct wave; fb and fe respectively represent a preset starting frequency and a preset cutoff frequency in the amplitude spectrum of the dipole shear wave direct wave.

The electronic device of this embodiment may be configured to execute the technical solutions of the above method embodiments, and the implementation principle and the technical effect are similar, which are not described herein again.

Fig. 9 is a schematic structural diagram of a terminal device according to another embodiment of the present application, where the terminal device may be a mobile phone, a computer, a tablet device, or the like.

Terminal device 900 may include one or more of the following N components: processing component 902, memory 904, power component 906, multi-N media component 908, audio component 910, input/output (I/O) interface 912, sensor component 914, and communication component 916.

The processing component 902 generally controls overall operation of the terminal device 900, such as operations associated with display, telephone calls, data communications, camera operations, and recording operations. Processing component 902 may include one or more N processors 920 to execute instructions to perform all or part of the steps of the methods described above. Further, processing component 902 can include one or more N modules that facilitate interaction between processing component 902 and other components. For example, processing component 902 may include multiple N media modules to facilitate interaction between multiple N media components 908 and processing component 902.

Memory 904 is configured to store various types of data to support operation at terminal device 900. Examples of such data include instructions for any application or method operating on terminal device 900, contact data, phonebook data, messages, pictures, videos, and so forth. The memory 904 may be implemented by any type or combination of volatile or non-volatile memory devices such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic or optical disks.

The power component 906 provides power to the various components of the terminal device 900. The power components 906 may include a power management system, one or more N power supplies, and other components associated with generating, managing, and distributing power for the terminal device 900.

The multi-N media component 908 includes a screen that provides an output interface between the terminal device 900 and a user. In some embodiments, the screen may include a Liquid Crystal Display (LCD) and a Touch Panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive an input signal from a user. The touch panel includes one or more N touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundary of a touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multiple N media components 908 include a front facing camera and/or a rear facing camera. When the terminal device 900 is in an operation mode, such as a shooting mode or a video mode, the front camera and/or the rear camera may receive external multi-N media data. Each front camera and rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.

The audio component 910 is configured to output and/or input audio signals. For example, the audio component 910 includes a Microphone (MIC) configured to receive external audio signals when the terminal apparatus 900 is in an operating mode, such as a call mode, a recording mode, and a voice recognition mode. The received audio signals may further be stored in the memory 904 or transmitted via the communication component 916. In some embodiments, audio component 910 also includes a speaker for outputting audio signals.

I/O interface 912 provides an interface between processing component 902 and peripheral interface modules, which may be keyboards, click wheels, buttons, etc. These buttons may include, but are not limited to: a home button, a volume button, a start button, and a lock button.

The sensor component 914 includes one or more N sensors for providing various aspects of state assessment for the terminal device 900. For example, sensor assembly 914 can detect an open/closed state of terminal device 900, the relative positioning of components, such as a display and keypad of terminal device 900, sensor assembly 914 can also detect a change in the position of terminal device 900 or a component of terminal device 900, the presence or absence of user contact with terminal device 900, orientation or acceleration/deceleration of terminal device 900, and a change in the temperature of terminal device 900. The sensor assembly 914 may include a proximity sensor configured to detect the presence of a nearby object in the absence of any physical contact. The sensor assembly 914 may also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 914 may also include an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

The communication component 916 is configured to facilitate communication between the terminal device 900 and other devices in a wired or wireless manner. Terminal device 900 may access a wireless network based on a communication standard, such as WiFi, 2G or 3G, or a combination thereof. In an exemplary embodiment, the communication component 916 receives a broadcast signal or broadcast associated information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 916 further includes a Near Field Communication (NFC) module to facilitate short-range communications. For example, the NFC module may be implemented based on Radio Frequency Identification (RFID) technology, infrared data association (IrDA) technology, Ultra Wideband (UWB) technology, Bluetooth (BT) technology, and other technologies.

In an exemplary embodiment, the terminal device 900 may be implemented by one or more N Application Specific Integrated Circuits (ASICs), Digital Signal Processors (DSPs), Digital Signal Processing Devices (DSPDs), Programmable Logic Devices (PLDs), Field Programmable Gate Arrays (FPGAs), controllers, micro-controllers, microprocessors or other electronic components for performing the above-described methods.

In an exemplary embodiment, a non-transitory computer readable storage medium comprising instructions, such as memory 904 comprising instructions, executable by processor 920 of terminal device 900 to perform the above-described method is also provided. For example, the non-transitory computer readable storage medium may be a ROM, a Random Access Memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like.

A non-transitory computer readable storage medium, wherein instructions of the storage medium, when executed by a processor of a terminal device, enable the terminal device to perform aspects of any of the above method embodiments.

Fig. 10 is a schematic structural diagram of a server according to another embodiment of the present application. Referring to fig. 10, server 1000 includes a processing component 1022 that further includes one or more N processors, and memory resources, represented by memory 1032, for storing instructions, such as applications, that are executable by processing component 1022. The application programs stored in memory 1032 may include one or more modules that each correspond to a set of instructions. Further, the processing component 1022 is configured to execute instructions to perform the schemes in the method embodiments described above.

The server 1000 may also include a power component 1026 configured to perform power management for the server 1000, a wired or wireless network interface 1050 configured to connect the server 1000 to a network, and an input/output (I/O) interface 1058. Server 1000 may operate based on an operating system stored in memory 1032, such as Windows Server, Mac OS XTM, UnixTM, LinuxTM, FreeBSDTM, or the like.

A non-transitory computer readable storage medium having instructions therein which, when executed by a processor of a server, enable the server to perform the aspects of any of the method embodiments described above.

Those of ordinary skill in the art will understand that: all or a portion of the steps of implementing the above-described method embodiments may be performed by hardware associated with program instructions. The program may be stored in a computer-readable storage medium. When executed, the program performs steps comprising the method embodiments described above; and the aforementioned storage medium includes: various media capable of storing program codes, such as a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, and an optical disk.

Finally, it should be noted that: the above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.